XploRA Nano - AFM-Raman for Physical and Chemical imaging

The XploRA Nano available from HORIBA Scientific is a fully integrated system developed based on the SmartSPM advanced scanning probe microscope and the XploRA Raman micro-spectrometer.

The XploRA Nano is compact, 100% automated,and user-friendly. It is built to concentrate the power of AFM-Raman into an inexpensive yet full-featured platform, rendering TERS imaging a reality for everyone. The TERS is a well-established system.

Features

Multi-Sample Analysis Platform

Macro-, micro-, and nano-scale measurements can be carried out on the same platform.

Ease-of-Use

Completely automatic operation enables users to begin measuring within minutes,instead ofhours.

True Confocality

Automatic mapping stages, high spatial resolution, and complete microscope visualization options.

High Collection Efficiency

Top-down and oblique Raman detection for the best resolution and throughput in co-localized as well as tip-enhanced measurements (Raman and photoluminescence).

High Spectral Resolution

Highest possible spectral resolution performance, wide spectral range analysis for PL and Raman, and multiple gratings with automated switching.

High Spatial Resolution

Nanoscale spectroscopic resolution (down to 10 nm) via tip-enhanced optical spectroscopies (Raman and photoluminescence).

Multi-Technique/Multi-Environment

Several SPM modes, such as conductive, AFM, and electrical modes (KPFM and cAFM), liquid cell, STM, and electrochemical environment, along with chemical mapping via TERS/TEPL. Complete control of the two systems via a single workstation and robust software control, spectrometer and SPM can be run concurrently or independently.

Robustness/Stability

High resonance frequency AFM scanners with noise-free operation. High performance is gained without active vibration isolation.