Probes 相关文章
  1. NT-MDT Probes for CONTACT/SEMICONTACT from Scanwel

    NT-MDT Probes for CONTACT/SEMICONTACT from Scanwel

    Due to the medium values of force constant and resonant frequency the CSG30 series probes from NT-MDT can be used in contact, semicontact and noncontact mode. Specifically designed for applications……

    仪器产品 2025-03-02

  2. Applied Nanostructures Silicon Probes

    Applied Nanostructures Silicon Probes

    Applied Nanostructures Silicon Probes are available in different configurations such as long and short cantilever for tapping and non-contact mode applications, multi-cantilever probes for force ca……

    仪器产品 2025-01-23

  3. Super Sharp Silicon AFM Tips from NanoWorld

    Super Sharp Silicon AFM Tips from NanoWorld

    NanoWorld Pointprobe® NCH probes are designed for non-contact or tapping™ mode imaging. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.……

    仪器产品 2025-01-23

  4. Applied Nanostructures Silicon Nitride Probes

    Applied Nanostructures Silicon Nitride Probes

    Applied Nanostructures Silicon Nitride Probes contains the world's first truly hybrid probes. They are also the only commercially available probes that allow for high resolution imaging in flu……

    仪器产品 2025-01-23

  5. Flat Tip AFM Probe from Applied NanoStructures

    Flat Tip AFM Probe from Applied NanoStructures

    Applied NanoStructures’ FT product is cylindrical post with a flat top. The diameter and height can be changed to match the application. The post can also be incorporated into any cantilever ……

    仪器产品 2025-01-23

  6. Coated AFM Tip - Extended Life High Aspect Ratio from Team Nanotec

    Coated AFM Tip - Extended Life High Aspect Ratio from Team Nanotec

    Tips are coated with conductive, wear resistent metal carbide.Smooth and well defined tip surface.Specifications: Radius after coating : Full cone angle: ~ 50 nm < 10° over l……

    仪器产品 2025-01-23

  7. Carbon Core High-Resolution (CCHR) AFM Probe from Carbon Design Innovations

    Carbon Core High-Resolution (CCHR) AFM Probe from Carbon Design Innovations

    Carbon Design Innovations' (C|D|I) carbon core high-resolution probes (CCHR) atomic force microscopy (AFM) start with a core carbon nanotube (CNT) that is then further processed and stabilized……

    仪器产品 2025-01-23

  8. Applied Nanostructures Doped Diamond Probes

    Applied Nanostructures Doped Diamond Probes

    Applied Nanostructures Doped Diamond Probes are compatible with most commercially available SPMs. These probes are nanofabricated using highly doped single crystal silicon with unparalleled reprodu……

    仪器产品 2025-01-23

  9. Plateau Tip Silicon-SPM-Probes from NANOSENSORS

    Plateau Tip Silicon-SPM-Probes from NANOSENSORS

    The Plateau Tip series based on the well-established NANOSENSORS™ Silicon-SPM-Probes exhibit an intentionally blunt tip with a well-defined circular end-face located at the free end of a micr……

    仪器产品 2025-01-23

  10. Conductive Diamond Coated AFM Tip from NANOSENSORS

    Conductive Diamond Coated AFM Tip from NANOSENSORS

    For applications that require a wear resistant and an electrically conductive tip we recommend this type. Some applications are Tunneling AFM and Scanning Capacitance Microscopy (SCM). The CDT Diam……

    仪器产品 2025-01-23

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    Angstrom Advanced Offers Portable X-ray Flaw Detector

    The AXFG series detector available from Angstrom Advanced is fitted with a rippled ceramic x-ray tube. This rippled ceramic x-ray tube provides a number of benefits, such as higher stability, small……

    仪器产品 2025-01-23

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    Generate Pollutant-Free Zero Gas with the 111iQ Zero Air Supply

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    Teikruo Corporation

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    代理品牌 2025-06-15

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