4D STEM Diffraction System: The STEMx System
The STEMx® system can effectively enhance the current Gatan in-situ camera’s 4D STEM di……...

Applied Nanostructures Silicon Probes are available in different configurations such as long and short cantilever for tapping and non-contact mode applications, multi-cantilever probes for force calibration, probes for force modulation microscopy, probes for contact applications and probes with varying degrees of tilt compensation.
Applications
Direct optical view of the AFM tip
Tapping, contact and non-contact mode applications
Spring constant calibration of SPM probes
Force Modulation Microscopy
Imaging or Trench Depth Metrology.
The STEMx® system can effectively enhance the current Gatan in-situ camera’s 4D STEM di……...
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