Pacer International Ltd
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Applied Nanostructures Silicon Probes
Applied Nanostructures Silicon Probes are available in different configurations such as long and short cantilever for tapping and non-contact mode applications, multi-cantilever probes for force calibration, probes for force modulation microscopy, probes for contact applications and probes with varying degrees of tilt compensation.
Applications
Direct optical view of the AFM tip
Tapping, contact and non-contact mode applications
Spring constant calibration of SPM probes
Force Modulation Microscopy
Imaging or Trench Depth Metrology.
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