Super Sharp 1nm NT-MDT AFM Probes from Scanwel

Super sharp diamond-like carbon (DLC) tips* with typical curvature radius 1nm are extremely useful for obtaining high resolution on object with sizes of several nanometers. DLC tips have very long lifetime due to the high material durability.

DLC tips can be grown on any standard probe series.

To guarantee 20 nm working length of DLC tips TEM is used. 10% from total number of probes in the branch are selected for testing. At least 80% of those probes should have the only DLC tip which length is exceeded by 20 nm others DLC tips on the same probe. In this case the whole batch is considered as passed the TEM test. On the surfaces with roughness bigger than 20 nm double images are possible.

Super Sharp DLC Tip Specifications

Material - Diamond-like carbon

Curvature radius - 1-3nm

Working length - >20nm

Probe Specifications

Chip size - 3.6x1.6x0.4mm³

Reflective side coating - Au

Chip has one rectangular cantilever

* - DLC tips can be grown on any other probe series by request