Pointprobe- Silicon AFM Probes from Nanoworld

The Pointprobe� is a versatile silicon AFM probe for very high resolution imaging and fits to all well-known commercial SPMs (Scanning Probe Microscopes). It consists of a single crystal silicon cantilever with integrated single crystal silicon tip. The cantilever and the tip are supported by a single crystal silicon holder. True atomic resolution has been achieved by several research facilities in UHV using the Non-Contact / TappingMode AFM probes NCH and NCL.

All data are subject to change without notice. All data are typical values, for guaranteed specifications see detailed description of probe type. In addition, special silicon AFM probes can be designed and manufactured upon customer's request. SSS -> SuperSharpSilicon Tip AR5 -> High Aspect Ratio Tip (5:1) AR10 -> Heigh Aspect Ratio (10:1) AR5T -> Tilt Compensated High Aspect Ratio Tip (5:1) DT -> Diamond Coated Tip CDT -> Conductive Diamond Coated Tip PtIr5 -> Platinum Iridium 5 Coating Reflex -> Aluminum Coating

General

SPM probe for very high resolution imaging

Fits to all well-known commercial SPMs

Mnolithic design of holder, cantilever and tip

Tip is pointing into the direction

Cantilever and tip are supported by a single crystal silicon holder

Material Features

Highly doped, single crystal silicon

High conductivity of the doped silicon avoids electrostatic charging

Resistively is as low as 0.01-0.025 Ohm*cm.

No intrinsic stress and absolutely straight cantilevers

No bending of cantilever by changing temperatures

Chemically inert silicon for application in fluids or electrochemical cells

Cantilever

Trapezoidal cross section of the cantilever

Rather wide detector side for easy adjustment

Small width at the tip side reduces the damages

 Holder

Cantilever is fixed to a silicon holder

Dimensions of the holder are very reproducible

Replacement of probe without major readjustment

Etched corners of the holder avoid contact between the holder and the sample

Tip

Tip is shaped like a polygon based pyramid and is located at the very end of the cantilever

Macroscopic half-cone angles - are 20� to 25� seen along the cantilever axis - are 25� to 30� seen from the side - taper to virtually zero at the very end of the tip

Tip radii are typically better than 10 nm

Tip height is 10-15 �m

For more information contact www.nanworld.com