EBSD Detector for Residual Strain Analysis and Phase Identification

The new QUANTAX e^–Flash^HD detector is designed with a native CCD resolution of approximately 2 MP (1600 x 1200 pixels) and advanced camera optics for reduced distortions. The e^–Flash^HD detector offers high definition Kikuchi patterns that exhibit the finest details.

Unlike its predecessor, the e^–Flash^HR, the e^–Flash^HD has a better cooling system that reduces the CCD's dark current by a factor of four, the generated Kikuchi patterns now are have a much better quality (higher signal/noise ratio). The new e^–Flash^HD detector uses a high efficiency and superior quality phosphor screen to obtain very detailed Kikuchi patterns. The integration of a small grain size phosphor material and a high pixel resolution CCD chip ensures a final pixel size in the patterns of 20 µm making visible miniscule alterations in the patterns.

The e^–Flash^HD is provided with ARGUS™ forescattered/backscattered electron imaging system. This offers valuable additional data for important and efficient microstructure characterization.

Furthermore, the e^–Flash^HD can be retrofitted with the innovative OPTIMUS™ TKD detector head for testing electron transparent samples in the finest sample-detector geometry possible.

Key Features

The main features of the QUANTAX e^–Flash^HD are given below:

Suitable choice for residual strain analysis aka HR-EBSD

Datasets containing e^–Flash^HD high quality patterns are ideal for cross correlation analysis with third party software like CrossCourt4

Ideal solution to run the pattern center calibration using techniques based on screen movement

ARGUS™ forescattered/backscattered electron imaging system enhances the detector’s versatility

High precision guiding system allows for a screen positioning precision better than 10 µm

Applications

The main applications of the QUANTAX e^–Flash^HD are as follows:

HR-EBSD (residual strain analysis)

Analysis of pseudo-symmetry in crystal structures

Ultra-accurate phase identification