Discovery Xenon Flash 200+ - High Speed Xenon-Pulse Delivery™ source (HSXD) and a multi-faceted Light Pipe™

上海仪舶实验室自动化 25-04-21 15:09:59

Discovery Xenon Flash 200+ - High Speed Xenon-Pulse Delivery™ source (HSXD) and a multi-faceted Light Pipe™

The Discovery Xenon Flash 200+ features a patented High Speed Xenon-Pulse DeliveryTMsource (HSXD) and a multi-faceted Light PipeTM. Together these optics deliver a light pulse of unsurpassed power and uniform intensity to the specimen while preventing sample holder overflash. Only TA Instruments high energy Xenon design is capable of testing samples to a diameter of 25.4 mm over a temperature range from -175 °C to 900 °C. The use of large samples diminishes errors associated with inhomogeneity and permits representative measurements of poorly dispersed composites. The DXF platform is designed for research and development programs as well as production control.

DXF 200+ Features

Sub-ambient temperature system with highly efficient liquid nitrogen cooling system and solid state PIN detectors for accurate and stable temperature control to an industry leading -175˚C.

Easily swappable autosampler trays can accommodate up to twelve samples 12.7 mm diameter or six 25.4 mm diameter samples, plus many more sizes and shapes.

Software controlled PIN loading can be adjusted to maintain perfect contact regardless of sample thickness.

Patented High Speed Xenon-Pulse-Delivery system provides 50% more energy than competitive designs for the highest degree of accuracy on widest range of samples regardless of thickness or thermal conductivity.

Wide variety of sample trays accommodates multiple sample sizes (up to 25.4 mm), shapes, and special fixtures (liquids, powders, laminates, films, etc.) for maximum sample testing flexibility.

Patented Light Pipe™ for the most effective collection and collimation of light and homogeneous delivery of radiation to the sample.

Can test samples with maximum diameter of 25.4 mm diameter for easier sample preparation and handling, as well as improved results for inhomogeneous materials.

Real-time pulse mapping for superior thermal diffusivity of thin and highly conductive materials.

Designed to meet industry standard test methods including: ASTM E1461, ASTM C714, ASTM E2585, ISO 13826, ISO 22007-Part4, ISO 18755, BS ENV 1159-2, DIN 30905, and DIN EN821

Specifications

Laser Source
Type Benchtop
Pulse Energy (Variable) Variable up to 25 Joules
Pulse Width 400 µs to 600 µsec
Proprietary Transfer Optics Light Pipe Beam Guide
Furnace
Temperature Range -150°C to 200°C
Atmosphere Air, inert, Max. vacuum (50 mtorr)
Detection
Thermal Diffusivity Range 0.01 to 1000 mm2/s
Thermal Conductivity Range 0.1 to 2000 W/(m*K)
Data Acquisition 16 bit
Accuracy
Thermal Diffusivity ±2.3%
Thermal Conductivity ±4%
Repeatability
Thermal Diffusivity ±2.0%
Thermal Conductivity ±3.5%
Sample
Round 8, 10, 12.7 & 25.4 mm Diameter
Square 8, 10 & 12.7 mm length
Maximum Thickness 10 mm
Autosampler
Type Two Positions

The Discovery Xenon Flash 200+

Video Credit: TA Instruments

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