A.P.E. Research TriA-Scanning Near Field Optical Microscope (SNOM)

The invention and subsequent development of scanning probe microscopy (SPM) methods have produced the necessary tools for a step forward in optical measurements. The possibility to go beyond the Abbe diffraction limit has been achieved with the Near-field light optical microscopes (SNOM or NSOM).

SNOM microscopes employ SPMs precision of piezoelectric raster-scanning together with sharp probes to obtain light optical images at rather better than the usual wavelength-limited resolution.

TriA-SNOM from A.P.E. Research is an Aperture SNOM microscope, capable of collecting optical signal in reflection, transmission and back-reflection modes. An instrument for surface science, optics and biology researchers who need a basic microscope easily expandable and interfaciable with their scientific equipement.

Key features:

Ease of Use

Versatility

Easily interchangeable Samples

Easy switching between acquisition modes

Lateral Resolution better then 50 nm