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DECTRIS ARINA Ultra-Fast 4D STEM Detector
The DECTRIS ARINA is an ultra-fast 4D STEM detector that does not trade off on sensitivity or dynamic range.
The DECTRIS ARINA retractable, electron-counting detector is designed to handle 4D STEM applications. It features a new ASIC and combines an extreme speed of up to 120,000 frames per second with a noise-free readout and a high dynamic range. Thisallowssuperior-quality data acquisition at the conventional speed of a traditional STEM measurement.
Owing to DECTRIS’ hybrid-pixel technology, ARINA can utilize various sensor materials and runs optimally in the entire energy range from 30 to 300 keV.
DECTRIS ARINA is ideal for a wide range of 4D STEM applications with dwell times lower than 10 μs, spanning from crystalline phases and orientation mapping to ptychography, including versatile STEM image reconstruction using virtual detectors.
Flexible: Comprising silicon (Si) or high-Z sensor materials, DECTRIS ARINA encompasses an extensive range of energies from 30 to 300 keV.
Rapid and sensitive: The DECTRIS ARINA can count every single electron—up to 10 pA/pixel even at a frame rate of 120 kHz.
Empowering: The DECTRIS team, comprising engineers and scientists, is ready to assist users in obtaining the maximum from their setup.
Get Up To Speed
Meet DECTRIS ARINA: A Hybrid-Pixel Electron Detector for Advanced 4D STEM Applications
Video Credit: Dectris Ltd.
Detector Specifications
Source: Dectris Ltd.
| . | . |
|---|---|
| Number of pixels (W x H) | 192 x 192 |
| Active area (W x H) [mm²] | 20 x 20 |
| Pixel size (W x H) [µm²] | 100 x 100 |
| Sensor material | Silicon (Si)or high-Z |
| Energy range [keV] | 30 - 300 |
| Frame rate (max.) [Hz] | 120,000 |
| Count rate (max.) [el/s/pixel] | 108 |
| Detective Quantum Efficiency, DQE(0) | at 80 keV -0.82 | at 200 keV - 0.75 |at 300 keV -0.75 |
| Detector mounting | Retractable |
*All specifications are subject to change without notice.
Novena Software
NOVENA, developed by eisTools for DECTRIS, presents a swift and user-friendly solution for visualizing and analyzing extensive 4D STEM datasets produced by the ARINA electron-counting detector. Its intuitive interface allows users to effortlessly define virtual detectors and calculate Center-of-Mass and Differential-Phase-Contrast images
Image Credit: Dectris Ltd.
Techniques
Four-Dimensional Scanning Transmission Electron Microscopy (4D STEM)
Image Credit: Dectris Ltd.
Users can gather 4D STEM data of the maximum quality with the precise and dependable electron-counting detectors from DECTRIS.
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