Applied Nanostructures Silicon Probes

上海仪舶实验室自动化 25-01-23 13:18:25

Applied Nanostructures Silicon Probes

Applied Nanostructures Silicon Probes are available in different configurations such as long and short cantilever for tapping and non-contact mode applications, multi-cantilever probes for force calibration, probes for force modulation microscopy, probes for contact applications and probes with varying degrees of tilt compensation.

Applications

Direct optical view of the AFM tip

Tapping, contact and non-contact mode applications

Spring constant calibration of SPM probes

Force Modulation Microscopy

Imaging or Trench Depth Metrology.

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