Achieving High Quality Images of Non-Conductive Samples via SEM with the ION COATER

During SEM analysis, the specimen is irradiated with an electron beam and that causes a buildup of electric charges on the surface of the specimen and the quality of images decreases. Therefore in order to acquire high quality images of non-conductive samples via SEM, it is essential to form a conductive layer on the surface.

The conductive coating prevents the sample from the surface charge and provides a ground‐potential surface, so that electric fields outside the sample are removed.

To prevent charge buildup on the surface of the non-conducting specimen, an ultra-thin coating of electrically-conducting metal - such as chromium (Cr) gold (Au), platinum (Pt), silver (Ag), gold/palladium (Au/Pd), or iridium (Ir) - is required. This process is called Ion-Sputter Coating. Inovenso ION COATER is suitable to use with all SEMoscope Desktop Scanning Electron Microscope versions.

Specifications