ZSX Primus III NEXT Tube-Above WDXRF Spectrometer

The ZSX Primus III NEXT performs rapid elemental analysis andquantification of main and trace elements (₄Be to ₉₆Cm). Its high throughput, great sensitivity, and low cost make it a perfect choice for industrial applications.

Key Features

High throughput: Provides accurate results in minutes

High-end WDXRF: Perfect for industrial applications

Extended detection range: Be to Cm

ZSX Guidance software: Enhances usability and assists with calibrations

Tube-above optics: Eliminates particulate contamination, ensuring consistent, reliable results

Attractive pricing: WDXRF performance at an affordable price

Tube-Above Optics

Rigaku’s unique tube-above optical configuration prevents dust and particles from contaminating optical components and distorting readings while decreasing maintenance and maximizing uptime. As a result, it is perfect for analyzing pressed powder samples. Moreover, wavelength-dispersive X-Ray fluorescence (WDXRF) outperforms energy dispersive X-Ray fluorescence (EDXRF) regarding spectral resolution.

Improved Quality of Analytical Results

The ZSX Primus III NEXT incorporates several significant improvements over its predecessor, resulting in improved results and higher throughput levels. These include:

Using a digital multi-channel analyzer (D-MCA) and effective control of each drive unit increased quantitative analysis throughput by 21%.

An S-PC LE is a gas-shielded proportional detector for light elements that is environmentally beneficial. The S-PC LE eliminates the need for a detection gas cylinder.

Powerful ZSX Guidance software, shared by Rigaku's flagshipWDXRF spectrometers, has a scheduling function to automate and streamlines operations.

Overview of the Main Features and Benefits

High-end WDXRF spectrometer for industrial environments: Cutting-edge industrial spectrometer for more harsh operating conditions

Enhanced reliability due to tube-above configuration: Less risk of spectrometer contamination increases uptime

Extended analytical flexibility: Full elemental analysis (₄Be to ₉₆Cm)

ZSX Guidance software: No need to be a specialist. Incorporated intelligence assists with calibration development

High-speed analysis: Accurate and precise results in minutes allow real-time process control

Attractive pricing: All this for an affordable price

Enhanced service and application support: Rigaku is a trusted partner

Data sharing: Makes it possible to have the Rigaku spectrometers in all the laboratories operating on the same calibrations

Image Credit: Rigaku Corporation

Image Credit: Rigaku Corporation

Image Credit: Rigaku Corporation

Main Markets and Pre-Calibration Packages

The primary application of WDXRF is to determine the composition of samples that are either raw materials, intermediates, or finished products. Specific industrial markets make extensive use of XRF technology. The ZSX Primus III NEXT is well-suited for the following applications:

Mining and minerals: The different kinds are typically raw materials for other industries. The analysis of main and minor oxides and trace elements may be necessary depending on the goal. The dedicated pre-calibrated methods OXIDE-FB-PAK and GEO-TRACE-PAK have been formulated to improve the needs of such applications.

Cement: This industry requires constant monitoring of raw materials, raw mix, clinker, and cement samples. High sample throughput and short analysis times are frequently required. The OXIDE-FB-PAK eliminates the need to create numerous calibrations for each sample type.

Steels and metals: Many metals and alloys are manufactured for several uses. The company provides application packages for the following metal groups: stainless steel, low alloy steel, FeNiCo-based alloys, and ferroalloys.

Petrochemicals/Polymers: It is difficult to envision a world without plastics. The concentration of additives and contaminants in various polymers can be determined using WDXRF.

Chemicals: Hundreds of chemicals, many of which are derived from minerals, are manufactured daily and are subject to quality control. WDXRF is a primary method used to guarantee the quality of these products. Rigaku can assist users in locating a suitable set of calibration standards.

Ceramics and refractories: Check the composition of raw materials which can directly influence final products.Similarly, confirm the composition of the final product to ensure it will perform in service.

Glass manufacturing: Ideal for monitoring the composition of raw materials.

Environmental: Check for contaminants e.g. heavy metals in soils at trace levels.

Image Credit: Rigaku Corporation

Image Credit: Rigaku Corporation

Hardware Features and Benefits

Tube-Above Optics

In high-precision analytical instruments, there is always the risk that an untrained operator would harm the spectrometer. The equipment is safe with the ZSX Primus III NEXTeven if a pressed pellet cracks inside the spectrometer due to its tube-above optics.

Image Credit: Rigaku Corporation

Avoid powder spills into the optical chamber. Tube above optical configuration (left) vs. tube below (right). Image Credit: Rigaku Corporation

Sample Throughput

Sample throughput has been enhanced by:

Multi-tasking control of drive units

High-speed data processing

For instance, consider the quantitative examination of 16 constituents in a cement sample. Time can be saved by roughly 21% compared to the prior model.

Image Credit: Rigaku Corporation

Improved Precision Through Higher Counting Linearity

A DMCA (Digital Multi-Channel Analyzer, 1024 channels) allows faster data collection and processing. High-speed digital processing boosts analytical accuracy by enhancing counting linearity and maximum counting rate (linearity: less than 1% relative error)

Scintillation counter 1800 kcps

Gas-sealed proportional counter 3000 kcps

Gas flow proportional counter 3000 kcps

Image Credit: Rigaku Corporation

Gas-Free Installation Possible

Optional gas-sealed proportional counter for light element analysis (S-PC LE):

₈O–₂₈Ni

In case P10 gas is difficult to obtain

Simpler, gas-free installation

Image Credit: Rigaku Corporation

Software Features and Benefits

ZSX Guidance Software

Strong user support, including generating measurement conditions and calibration aid for experienced and novice WDXRF users.

User-friendliness is ensured by integrated software for day-to-day analysis and service or maintenance.

Customize software access authorization levels based on operator experience to prevent unintentional software misuse and to prevent calibration parameters from being modified.

SQX is a powerful standardless FP software suite for analyzing fully unknown samples.

Flow Bar Scheme

The flow bar allows for intuitive application creation and configuration.

Image Credit: Rigaku Corporation

Improved Reliability of Analytical Results

Next to the analytical result is the estimated standard deviation from a single measurement:

Image Credit: Rigaku Corporation

The following table displays the estimated standard deviation from a single measurement to the standard deviation from 10 repeated measurements. The estimated and observed standard deviations are quite close.

Table 1. Source: Rigaku Corporation

		Mn	P	S	Si	Ni	Cr	Mo
single measurement	analysis result	1.202	0.020	0.008	0.908	15.18	15.77	0.470
	Std deviation	0.0023	0.0004	0.0003	0.0030	0.0088	0.0117	0.0008
10 repeated measurements	average analysis result	1.205	0.020	0.007	0.905	15.18	15.76	0.471
	Std deviation (actual)	0.0027	0.0002	0.0001	0.0030	0.0082	0.0077	0.0006

Spectrometer Parameters in Results View

The status of the X-Ray spectrometer’s physical characteristics, such as vacuum, temperature, and detector gas flow rate, can have a significant impact on analytical results.

The ZSX software results display shows the most critical parameters and a hardware error message is provided.

Verify analysis results quickly when a parameter is out of specification.

Image Credit: Rigaku Corporation

Automatic Calculation of Detection Limits

The calibration curve immediately displays the Lower Limit of Detection (LLD), calculated using the measurement conditions.

The LLDs for each standard are calculated while accounting for spectral interferences.

LLDs are also listed as a “Det. Limit” in the results display window.

Image Credit: Rigaku Corporation

Image Credit: Rigaku Corporation

User Access Level Setting

Setting access levels for operators to prevent human errors:

Calibration changes or deletions

Analytical results editing

Unwanted service activities

Certain software functionalities will be available depending on the user-level setting:

Full menu. Image Credit: Rigaku Corporation

Routine analysis. Image Credit: Rigaku Corporation

ZSX Guidance logon window. Image Credit: Rigaku Corporation

Time-Saving Daily Analysis Management Tool

Image Credit: Rigaku Corporation

Scheduler function:

Automatic start-up of the spectrometer

X-rays on

Aging

PHA measurement

Automatic Quality Check (QC) and Drift Correction (DC)

Application Sharing and Support



Image Credit: Rigaku Corporation

Plants with similar X-Ray spectrometers can share applications between systems

Knowledge transfer

Increased productivity by lowering the workload of less experienced users

The data pack function simplifies testing analysis methods, examining error log files, and monitoring spectrometers from remote locations.

Specifications

Table 2.Source: Rigaku Corporation

ZSX Primus III NEXT
Analytical range		8O - 96Cm standard (4Be - 96Cm Optional*1)
Spectral method		Wavelength dispersive
Atmosphere		Vacuum
X-ray generator system	X-ray tube	End window type Rh target 3 kW
	High voltage generator	High-frequency inverter system
	Heat exchanger	Pure water circulation supplier (built-in)
Spectrometer	Irradiation method	Tube-above
	Sample changer	Expandable sample changer with up to 48 positions
	Sample inlet	Air lock system
	Maximum sample size	∅ 52 mm — 30 mm (H)
	Primary filter	Ni400, Ni40, Al125, Al25
	Analysis area diaphragm	4 sizes automatic exchange mechanism 35, 30, 20 and 10 mm
	Primary Soller slit	3 positions automatic exchange machanismStandard and fine slits / Optional: Ultralight element slit
	Goniometer	θ-2θ¸ independent driving mechanism
	Continuous scan	0.1°~240° /min
	Crystal exchanger	10 crystal automatic exchange mechanism
	Analyzing crystal	Standard: LiF, 200, PET, RX26Optional: Ge, LiF, 420, LiF(220), RX9, RX4, RX35, RX40, RX45, RX61, RX61F, RX75
	Vacuum system	One shared vacuum pump between sample- and analyzing chamber.Sample powder trap filter
Counting system	Pulse height analyzer	Digital multichannel analyzer (DMCA)
	Detector	SC (Scintillation counter)F-PC (Gas flow proportional counter)Optional: S-PC LE (Gas sealed proportional counter: does not require P-10 gas)

^*1 depending on crystal configurations

Installation Requirements

Table 3.Source: Rigaku Corporation

.
Required power supply		Instrument: Single (200 - 240 V), three phase (200 V) 50/60 Hz 40APersonal computer: 1-phase, 100-240 V, 10A
Grounding specification		30 Ω or below grounding (independent)
Cooling water		Temperature: Lower than 30 ºC Pressure: 0.29 - 0.49 MPa Flow: More than 5 l/min Quality: Equivalent to drinking water
Drained water		Gravity drain
Room temperature		18 - 30 ºC Daily variation within ±2 ºC
Relative humidity		75% RH or less
Vibration		Less than 2 m/s2 Not detectable by a human
Gas for detector		P10 Gas (argon 90% methane 10% mixed gas). Pressure 0.15 MP a, 7 ml/min. Not required if S-PC LE is selected