ZEISS EVO MA: Interactive SEM Analysis

上海仪舶实验室自动化 25-01-23 14:18:06

ZEISS EVO MA: Interactive SEM Analysis

Carl Zeiss’ SEMs from the ZEISS EVO range combine high-performance scanning electron microscopy with a perceptive operation that is ideal for regular analyses and also for research applications.

This range has a user-friendly nature and helps both new users and trained microscopists. With the help of its extensive range of options, every model can be tailored to the requirement of analyses in life sciences or materials science, or even industrial quality assurance and failure analysis.

Users can take advantage of:

Excellent image quality

Top-class usability

Availability of data integrity and workflow automation

The ZEISS EVO 10 comes with an Element EDS system and an optional backscatter detector. It is considered the launchpad for scanning electron microscopy, at an extremely affordable price. This system stands isolated from tabletop SEMs and is also the smallest of EVO vacuum chambers that ensures the implementation of experiments that require more space and ports compared to what users predict at present.

EVO 15 excels in analytical applications. Users can choose the bigger vacuum chamber and add variable pressure for examining non-conductive samples. Furthermore, users can profit from a flexible and multi-purpose solution available for central microscopy facilities or industrial quality assurance laboratories.

EVO 25 is considered the industrial workhorse solution that accommodates even the biggest parts and assemblies. Users can choose an 80 mm Z travel stage that can handle weights ranging up to 2 kg even with tilt. Moreover, it is possible to integrate several analytical detectors into the huge chamber for microanalysis applications.

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