Coherix
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Rigaku has developed the XtaLAB Synergy-S X-ray diffractometer for single-crystal X-ray diffraction. Using a combination of cutting-edge components and user-inspired software combined through a highly parallelized architecture, the XtaLAB Synergy-S produces fast, precise data in an intelligent fashion.
The technology of the XtaLAB Synergy-S is based on that which has been used to power the PhotonJet-S series of microfocus X-ray sources, both of which incorporate continuously variable divergence slits.
Both of these third-generation systems have been specifically designed to maximize a sample’s X-ray photons through the use of novel optics, a new and longer lifespan, tubes, and an overall improved alignment system.
PhotonJets can be made available in copper, molybdenum or silver wavelengths in either a single or dual source configuration.
This diffractometer is equipped with a kappa goniometer that exhibits both rapid motor speeds and a unique telescopic two-theta arm to ultimately provide users with the highest level of flexibility during diffraction experiments.
Furthermore, the XtaLAB Synergy-S also comes with HyPix-6000HE, PILATUS3 R 200K, PILATUS3 R 300K, or EIGER 1M.
Product Benefits
Extremely high performance as a result of bright source, noise-free X-ray detector, and fast goniometer speeds
Minimal downtime with longer X-ray tube lifetime - supported by online diagnostics and troubleshooting
Continuously variable divergence slit option lets you resolve reflections from long unit cells
Compact design to fit in your laboratory
Product Features
High source flux and increased goniometer speed to allow quicker, more agile experiments
Enhanced kappa goniometer design with symmetrical 2θ positioning
Unique telescopic two-theta arm to reach both longer and shorter crystal-to-detector distances
Improved X-ray optic alignment mechanism for easy maintenance
New electronically controlled brightness of cabinet and crystal lighting
User-inspired cabinet design for improved workflow
Rigaku XtaLAB Synergy-S - Single or dual microfocus X-ray diffractometer
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