Xeuss Pro for Nanoscale Characterization

上海仪舶实验室自动化 25-01-23 13:46:05

Xeuss Pro for Nanoscale Characterization

Xeuss Pro is the latest X-ray scattering laboratory beamline from Xenocs. Specifically designed for characterizing nanostructured materials, the Xeuss Pro advanced beamline employs Small-Angle X-ray Scattering and Wide-Angle X-ray Scattering (SAXS/WAXS) in both grazing incidence (GI) and sample transmission to acquire structural data at the atomic scale and nanoscale.

Thanks to optional Ultra-Small Angle X-ray scattering (USAXS) and X-ray Imaging modules, the characterization scale can be extended to structures ranging from a few microns to millimeters.

Download the Brochure for More Information

SAXS/WAXS/GISAXS/USAXS/Imaging Beamline for the Laboratory

Building on over two decades of innovation and a decade of customer experience with Xeuss SAXS systems, the Xeuss Pro beamline sets new standards in X-ray scattering instrumentation. Engineered for exceptional versatility and precision, it enables atomic- to nano-scale characterization for both scientific research and industrial applications, all within your lab.

Maximum Flexibility

Through fully motorized changes of instrument configurations, users can extend the resolution of the characterized structures from the atomic scale up to a few microns and even to millimeters. This provides structural tools for a large number of users with high throughput and complete remote operation.

Unique Measuring Performance

The Xeuss Pro provides exceptional data quality in terms of high signal-to-noise, detectable Q-range, and absolute intensity precision. Users can achieve better measurement quality through premium detectors, optics, sources, and long-travel Q-Xoom moving detectors.

Plenty of Space for Sample Environments

The Xeuss Pro allows unique freedom and space in the sample area, without requiring users to move their samples to change the resolution of the instrument. This feature provides flexibility for upcoming sample environment requirements.

Multi-Application Instrument

As a multi-application instrument, the Xeuss Pro can be used to define a wide range of materials, such as semi-crystalline or block polymers, alloys, proteins in solutions, nanoparticles, and colloids.

The Xeuss Pro comes with a robust software suite, including Xenocs XSACT Pro data analysis software, which features comprehensive algorithms and an intuitive user interface for an enhanced user experience.

Examples of applications and measuring parameters are given below:

Size distribution of particles in powders or dispersions between a few nanometers and a few hundred nanometers.

Lamellar structure and crystalline fraction for semi-crystalline polymers.

Structural orientation in stretched polymers.

Phase analysis for liquid crystals or mesoporous systems.

Shape and size of nano-objects.

The molecular weight of polymers or proteins diluted in a solution.

Dynamic analysis of nanostructures based on shear, tensile, humidity, and temperature.

Key Features and Benefits

The Xeuss Pro offers high flexibility in measurement configurations, combined with a high degree of automation in data acquisition, to ensure optimal data quality for all types of samples. Key features include:

Motorized Bonse-Hart USAXS, along with an additional movable WAXS detector.

Motorized multi-energy source depending on sample absorption.

The auxiliary X-ray beam focusing channel that provides a photon density increase by one order of magnitude.

X-ray imaging module, including Dark-Field and Phase-Contrast Imaging options.

Long-travel Q-Xoom in-vacuum moving detector.

Very large surface of detection for optimized resolution or anisotropic samples.

Extremely large vacuum chamber with large free space at the sample area.

Beamstop-free data acquisition for high dynamic range and highly precise data.

Clean beam technology providing low background and high intensity.

Download the Brochure for More Information

Fields of Research

The Xeuss Pro is a perfect shared characterization facility instrument designed to reliably fulfill the requirements of material scientists and X-ray scattering experts working in numerous fields of research:

Polymer research

Structural biology

Colloids and nanoparticles

Food science

Oil and gas

Inorganic materials

Renewable energy

Cosmetics and consumer care

Semiconductors

Pharmaceuticals

For more information on SAXS applications, visit Xenocs’ website, or Request a Quote above.

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