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X-Ray Analytical Microscope: XGT-9000
The XGT-9000 X-ray analytical microscope from HORIBA Scientific is an evolution of μXRF. The microscope offers a combination of enhanced sensitivity and new imaging technology to realize the high-speed analysis of foreign materials using a single unit.
Features
Easy analysis operation without the need for preparation and non-destructive analysis
Complete with a range of image analysis software provided
Measurement points can be rapidly accessed via high precision optical observation, even in the microscopic range
XGT-9000
Video Credit: HORIBA Scientific
Clear and High-Speed Image Mapping
Reduced analysis time ensures efficient measurement work
X-ray images with very limited noise enable even clearer observation
Image Credit: HORIBA Scientific
Clear Optical Image Observation and Coaxial X-Ray Irradiation
Fitted with three types of illumination: transmitted, aroundand coaxial. Integrating coaxial and around illuminations allows clear observation of samples with regions that are mirrored, non-uniform, etc.
Image Credit: HORIBA Scientific
Coaxial, perpendicular X-ray exposure and optical image observation avoid misalignment of the measurement position of samples from becoming uneven.
Image Credit: HORIBA Scientific
Employing of Imaging Technology Based on Raman Imaging Technique
A specific element is highlighted as a characteristic point, thus streamlining the detection of obstacles, foreign material, etc.
Image Credit: HORIBA Scientific
A New Solution in Foreign Material Analysis
The XGT-9000 enables foreign material to be rapidly detected via high-speed screening and highlighting by imaging processing. The high-resolution X-ray beam allows an elaborate analysis of elements constituting the foreign material. This sequence of foreign material analyses can be done with the help of a single unit, to the level of several tens of micrometers.
Image Credit: HORIBA Scientific
Applications
Analysis of Foreign Material in Films
The XGT-9000 supports visual confirmation, detection, and analysis of even hard-to-detect foreign materials while verifying optical observation images with high resolution following elemental mapping screening.
Image Credit: HORIBA Scientific
Analysis of Hydrous Samples
The XGT-9000 allows the measurement of hydrous samples and detection of foreign materials with the help of image processing.
Image Credit: HORIBA Scientific
Specifications
Source: HORIBA Scientific
| Model | XGT-9000 | XGT-9000SL |
|---|---|---|
| Basic information | ||
| Instrument | X-ray fluorescence analytical microscope | |
| Sample type | Solids, Liquids, Particles | |
| Detectable elements | C* – Am *with optional light elements detector (F – Am with standard detector) | |
| Available chamber size | 450(W) x 500(D) x 80(H) | 1030(W) x 950(D) x 500(H) |
| Maximum sample size | 300(W) x 250(D) x 80(H) | 500(W) x 500(D) x 500(H) |
| Maximum mass of a sample | 1 kg | 10 kg |
| Optical observation | Two high-resolution cameras with an objective lens | |
| Optical design | Vertical-Coaxial X-ray and Optical observation | |
| Sample illumination/observation | Top, Bottom, Side illuminations/Bright and Dark fields | |
| X-ray tube | ||
| Power | 50 W | |
| Voltage | Up to 50 kV | |
| Current | Up to 1 mA | |
| Target material | Rh | |
| X-ray optics | ||
| Number of probes | Up to 4 | |
| Primary X-ray filters forspectrum optimization | 5positions | |
| Detectors | ||
| X-ray Fluorescence detector | Silicon Drift Detector (SDD) | |
| Transmission detector | NaI(Tl) | |
| Mapping analysis | ||
| Mapping area | 100 mm x 100 mm | 350 mm x 350 mm |
| Step size | 2 mm | 4 mm |
| Operating mode | ||
| Sample environment | Full vacuum / Partial vacuum /Ambient condition / He purged condition(Optional) | Partial vacuum / Ambient condition / He purged condition (optional)**He purge condition is necessary to detect down to carbon and fluorine for both detectors. |
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