WITec alpha300 A: Atomic Force Microscope (AFM)

The alpha300 A atomic force microscopefrom WITecis a modularnano-imaging system integratedwith a research-grade optical microscope. It provides high-resolution sample survey,accurate cantilever alignment, and exceptional optical access.Aproprietary AFM objective allows simultaneous cantilever and sample observation

The alpha300 A was designed and developed to be used with other imaging methods such as confocal Raman imaging and SNOM.Researchers can switch between the different techniques by just rotating the microscope objective turret.

Whetherin air or liquid environments, or even with delicate and soft samples, the alpha300 A is ideally suited to the investigation of topographic structures at the highest resolution. For high-performance materials research imaging tasks, the alpha300 A can be equipped with the Pulsed Force Mode, allowing local surface properties such as local adhesion or stiffness to be imaged along with topography on the nanometer scale.

Other microscopy techniques than can be incorporatedwith the AFM include fluorescence, polarization analysis, photoluminescence anddark field and bright field imaging.

Key Features of the alpha300 A

A wide range of available AFM modes

Surface characterization can be achieved on the nanometer scale