Using the LFA 717 HyperFlash for Light Flash Analysis

The LFA 717 HyperFlash^® is a cutting-edge device for accurately measuring thermal diffusivity in various materials. Its advanced calculation methods are at the forefront of scientific innovation and ensure the accuracy required for materials analysis.

Broad sample range: The LFA 717 HyperFlash^® can handle a variety of sample materials, including round and square-shaped specimens. It includes an automatic sample changer that can handle up to 16 samples at once, improving laboratory efficiency.

Flexible temperature control: The device provides amazing versatility in selecting a measurement range of up to 500 °C. Using liquid nitrogen, it can evaluate samples at temperatures as low as -100 °C. In addition, a compressed air device can measure sub-ambient temperatures as low as 0 °C. The integrated evacuation system enables measurements in predefined atmospheres.

Advanced corrections specifically for thin or highly conductive samples: An improved analysis pulse correction capability is now available in the most recent edition of the software, which is intended for high-precision applications where remarkable time resolution is essential. This improvement is especially helpful when examining thin or highly conductive samples, as well as when the light pulse and the sample’s thermal response occur at the same time.

The LFA 717 HyperFlash^® is an indispensable instrument for researchers and industries that require precise thermal property measurements, making it a valuable asset in materials science.

The instrument's top cover provides a convenient place for sample preparation and storage. It has been meticulously created with four visually distinct portions, each representing a separate specimen location within the furnace. This novel architecture facilitates sample identification and pre-assembly, reduces instrument downtime, and is especially useful in multi-user scenarios.

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Method

Efficient Determination of Thermophysical Properties with the Light Flash Method

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The Light Flash (LFA) technique is a quick, precise, non-contact, non-destructive way to evaluate thermal diffusivity.Using a reference sample, this novel method calculates thermal diffusivity and describes the specific heat of materials.

In the LFA method, a brief energy pulse heats the front surface of a plane-parallel sample. The ensuing temperature change on the back of the sample is measured using an infrared (IR) detector. These statistics can be used to characterize thermal diffusivity and specific heat.

These thermophysical characteristics are added to the density using the following formula to determine the thermal conductivity:

λ(T)=a(T)⋅cp⋅ρ(T)

Where:

λ = thermal conductivity [W/(m·K)]

a = thermal diffusivity [mm²/s]

c_p = specific heat [J/(g·K)]

ρ = density [g/cm³]

With its ability to study a wide range of materials at different temperatures, the LFA approach is critical for researchers and companies interested in understanding thermal properties in depth.

Specifications

Source: NETZSCH-Gerätebau GmbH

Proven Excellence in Service

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At NETZSCH Analyzing & Testing, NETZSCH-Gerätebau GmbH provides a complete range of services worldwide to maintain the best operation and longevity of thermo analytical equipment. With a proven track record of excellence, the services are designed to improve device efficacy, extend lifespan, and reduce downtime.

Software

Proteus^® Software for LFA - Fast, Efficient, and Seamlessly Integrated!

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The Proteus^® 64-bit software is licensed with each instrument, allowing users to connect numerous instruments via USB at the same time or run the software on separate computer systems. This software suite, included in the NETZSCH Assistant beginning with version 9.5, connects a diverse set of NETZSCH instruments and third-party apps into a unified management framework.

The switch from the old database format to a new, quicker SQL database format is a major improvement unique to Laser Flash Analysis (LFA). This data architecture change has resulted in improved modeling speeds and up to 2.5 times faster results while utilizing less memory.

As a result, users can now keep nearly an infinite number of metrics in a single database. There is still complete support for all common database management tasks, such as import/export and data merging.

Proteus LFA Measurement Software

Users can efficiently establish, monitor, and optimize measurements with the help of the LFA 717 HyperFlash^® measurement software, a crucial tool for connecting and managing hardware and instrument accessories. This program, created to improve automation, is highly customizable and suitable for various industries.

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Proteus LFA Analysis Software

The specialized, standalone Proteus^® LFA analysis software offers strong data analysis based on analytical models in addition to measuring capabilities. Important characteristics include:

Comprehensive Data Analysis

Post-processing is not required because users can examine several measurements at once within a single plot. This simplification increases accuracy and saves time.

Export Detailed Documentation

Proteus^® LFA offers a wide range of export options for creating complete documentation of outcomes, which is essential for quality assurance and reporting.

Save Analysis States

Convenient sequential analysis made possible by the ability to save analysis states makes it easier to carry out follow-up analyses without starting from the beginning.

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Models and Corrections

Unmatched mathematical models that are incorporated for accurate and transparent evaluation. Apart from the so-called modified Cape-Lehman model, the standard model for opaque, homogeneous, and isotropic samples, models exist for specific application needs and corrections.

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All models have a light pulse and baseline correction as a standard for a better fit and better outcomes. The user has the option to disable these corrections. The above-described models account for heat loss; additionally, the adiabatic (Parker) Model is offered.

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Enhanced Pulse Correction

In the most recent edition of the analysis software, NETZSCH-Gerätebau GmbH is happy to provide a revised and extremely precise pulse correction function. This feature enables users to access samples that require high time resolution, making it especially useful for thin or highly conductive materials. It is especially effective when the light pulse coincides with the thermal response of the sample.

The calculation dialog allows users to choose from several correction methods, including:

Equivalent Square

Center of Gravity

Double Exponential Pulse Correction

Impact on Model Function and Fit Quality

Implementing pulse correction has a major impact on the appearance of the model function and its goodness of fit. Below is an example of a high-diffusivity material with a thermal diffusivity (α) of 800 mm²/s, with a 1 ms pulse signal added to the detector signal.

Depending on whether the exponential pulse correction is used or not, the calculated thermal diffusivity can vary by more than 20%. Therefore, pulse correction procedures are imperative to obtain reliable analysis results.

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This Instrument is LabV^®-Primed

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LabV^®¸ extracts information from the analytical device: All measurement data is instantly imported into the LabV® software, a single, secure database solution. This makes it possible for users to search and view the data in LabV®. Now, the data will be available from any location. Additionally, users cancreate reports.