Ultra DI 20 Plus Particle Counter for Ultrapure Water Monitoring

上海仪舶实验室自动化 25-01-23 13:42:12

Ultra DI 20 Plus Particle Counter for Ultrapure Water Monitoring

The Ultra DI 20 Plus particle counter has been meticulously designed and fine-tuned to meet the demands of ultrapure water monitoring on a global scale.

By effectively counting and sizing particles as tiny as 20 nm, the Ultra DI 20 Plus system stands as a benchmark for exceptional particle detection capabilities.

It excels with its high counting efficiency, minor zero-count, consistent performance across various locations and environmental conditions, and the added benefit of not incurring extra costs for an environmental enclosure.

As a result, the UDI 20 Plus provides customers with a dependable and precise solution for liquid optical particle counting.

What sets the Ultra DI-20 Plus apart is its remarkable ability to maintain stable particle measurements within an operating temperature range of 18 to 29 °C, ensuring unparalleled data consistency and alignment between instruments.

This particle counter even offers instrument matching with less than a 20% discrepancy at concentrations exceeding 2 particles per milliliter, a vital requirement frequently demanded by the current semiconductor industry.

This product allows users to place unwavering trust in their ultrapure water (UPW) data, regardless of the specific particle counter unit users utilize.

Users have the freedom to seamlessly interchange particle counters or compare data across different locations with the confidence that the data remains consistent. This comparability extends its benefits from Fabs in the same town to Fabs spanning the globe.

Furthermore, this simplifies the logistics of annual equipment calibration since users can swap instruments within their fleet without causing disruptions or raising questions about data integrity.

The Ultra DI-20 Plus guarantees absolute precision by meticulously regulating the internal environment within the instrument case.

Regardless of where users position the unit, the UDI-20 Plus consistently generates the most accurate and reproducible 20 nm particle data achievable. Moreover, it eliminates the requirement for additional expenses related to purchasing and maintaining an environmental enclosure.

Benefits

Powerful laser optics and sensors can detect particles as small as 20 nm (9 nm Au).

Swift sample cleanup reduces the time needed to move from one sample point to another

Act promptly in response to contamination by utilizing real-time particle measurement

Effortlessly acquire valuable statistical data for the prompt detection of particle irregularities and efficient troubleshooting

Eradicates the need for extra expenses associated with acquiring and maintaining an environmental enclosure.

Features

Unrivaled instrument-to-instrument data stability and alignment achieved through thermally stabilized particle measurements within an operating range of 18 to 29 °C

Instrument to instrument matching within a 20% tolerance for concentrations of >2 particles per milliliter

Swap users’ fleet of instruments without causing disruptions or raising doubts about data integrity

Seamlessly compare UPW system performance across multiple fabs, regardless of environmental conditions, anywhere in the world

Two distinct counting modes are available:

High resolution-for pure environments

High concentration-Suitable for filter challenge tests and less pure settings

Easily establish direct connections to PLC and SCADA systems using a 4–20 mA interface, and make use of the existing network with Ethernet communication

Applications

Measuring particle concentration within cutting-edge ultrapure water (UPW) systems

Evaluating filter efficiency

Identifying bacterial growth in UPW systems

Conducting trend analysis at reduced particle concentrations

Providing uninterrupted system monitoring

Tracking and alarming for episodic events

Specifications

Source: Particle Measuring Systems

. . .
Channels 4
Channel sizes 20, 50, 70, 100 nm
Flow rate (ml/min) 75 ml/min ± 10%
Counting Efficiency 100% of sampling volume
Sample temperature 59 – 122 °F (15 – 50 °C) 1
Maximum pressure 100 psi
Zero count ≤ 50 counts/L 2
Exterior surface 316L Stainless steel
Wetted surface materials Teflon®, Kel-F®, fused silica, Viton®, 96% Alumina Ceramic, and Simriz® 485
Dimensions (d, w, h) 20.0 x 16.8 x 14.5 in (50.8 x 42.7 x 36.8 cm)
Weight 71 lb (32.2 kg)
Communications Ethernet4-20 mA (5 outputs: 4 particle channels, 1 instrument status)RS-232 (set up and diagnostics only, no data)
Status indicator Laser, power, and activity: one (1) tri-color LED
Calibration Materials used are traceable to National Institute of Standards and Technology (NIST)
Electrical Rating 100 - 240V, 50 - 60 Hz, 5.0 A
Fuses 250 V, 5 x 20 mm, 5.0 A
Voltage fluctuation AC input voltage fluctuation shall not exceed ± 10%
Laser classification Class I complies with US21 CFR 1040.10 and EN60825-1.Internally an enclosed Class IV laser is used per EN60825-1.Operates with enclosure dorr open or closed
Environment Temperature: 64.4 – 84 °F (18 – 29 °C)± 1 °C /hour 3Humidity, Non-condensingMaximum altitude: 6,562 ft (2,000 m)Indoor use onlyPollution degree 2 Over-voltage Category IIOrdinary protection (Not protected against harmful ingress of moisture)Class I environment (Electrical Earth ground from the mains power source to the product input is required for safety)
Storage and transportenvironment 41 - 113 °F (5 - 45 °C)5 - 90 % Humidity

1 For temperatures greater than 122 °F (50 °C), use of a chiller is recommended.2 Requires optimization by local Particle Measuring Systems service representative.3 Operating the unit above 29 °C is beyond a manner not specified by the manufacturer, and any risk mitigations provided by the unit may be impaired.

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