Ultima Expert - High Stability ICP-OES Spectrometer

High Sensitivity, High Resolution and High Stability ICP-OES Spectrometer.

The Ultima Expert is specially designed to handle the most challenging applications and offers the highest performance on the market

Total plasma view and radial viewing provide the lowest detection limits in ICP-OES spectrometry

Unique sheath gas feature offers unrivalled stability on samples with high total dissolved solids content, up to 30% dissolved solids

Continuous wavelength coverage from 120 to 800 nm with Far UV option and improved sensitivity for halogens analysis or the use of alternative wavelengths

Its high-quality optical design integrates a high density holographic grating and one meter focal length to provide the highest resolution on the market as well as high stability and sensitivity for the most demanding applications

Unmatched spectral resolution minimizes interference with <5 pm for wavelengths in the range 120 - 320 nm

Optional dual grating system, provides <6 pm resolution up to 450 nm for line-rich matrices such as geological or precious metals, and rare earth elements applications

Patented HDD^® detection provides sub-ppb to percent level in a single analysis

Dynamic range of up to 10 orders of magnitude using Image

Unique HiStab device can achieve exceptional stability for demanding applications

Optional 0.5 m or 1 m polychromator for simultaneous analysis

Image Navigator

Full spectrum display with multiple spectra display capability

Image navigator is designed for semi-quantitative analysis, thanks to full spectrum acquisition

Automated semi-quantitative and qualitative analysis

Visual comparison with overlaid spectra display capability

MASTER, Find Easily the Right Wavelength

MASTER enables method development by performing automatic selection of appropriate lines according to the concentration range of each element and the matrix. MASTER is based on the proprietary S³-base developed with real ICP spectra acquisitions and containing over 50,000 wavelengths identified with full spectroscopic data.

Automatic wavelength selection

Sensitivity, interference level, and dynamic range criteria to adjust line selection

Synthetic spectra display

S³-base Viewer

The entire S³-base database is displayed on the S³-base viewer, which helps to identify emission lines in unknown samples.

Full S³-base database available

Display of the list of potential emission lines, including plasma inherent lines, near a selected wavelength with their detection limits and relative intensities

Display of analyte wavelength and its detection limit and relative intensity

Graphic display of analyte emission line and potential emission lines for facilitated identification