TXRF Spectrometer for Ultra-Trace Elemental Analysis (sub ppb)

The S4 TStar is a high performance TXRF spectrometer used to perform analysis of ultra-trace elements. It is a cost-efficient and rapid spectrometer, providing a real alternative to ICP. The Total reflection X-ray fluorescence (TXRF) spectroscopy is a proven technique for trace element analysis of a range of samples.

The S4 TStar simplifies TXRF to handle 24/7 regular functioning along with guaranteed data quality. The major enhancements of detection limits are achieved with helpful software practices, automated QC methods, and a innovative versatility with regard to carriers and sample types.

It serves as an exceptional versatile tool for analyzing a range of samples on discrete reflective carriers. This feature places it ahead of ICP, as that needs completely dissolved liquid samples. It also offers a versatile solution for effluent, soil, water and air analysis used for the revival of a healthy environment, e.g., monitoring of environment through direct measurement of contaminants in slurries, wastewater and effluents in the low ppb range.

The S4 TStar serves as a powerful tool that can be used for the prevention of food fraud in globalized supply chains. For instance, food safety as per WHO/FAO standards can be achieved through direct analysis of low standards of As in rice.

Key Features

The main features of the S4 TStar spectrometer are as follows:

Automated quality control feature offers confidence in instrument and data quality.

Provides lowest detection limits in the sub-ppb range.

Highest versatility for a direct analysis of broad range of samples on distinct carriers.

Enhanced to operate for 24/7 in industrial custom analysis.

Devised for multi-user operation through a large capacity of 90 samples.

Sample trays and other tools selection reduces errors and contamination risks, and speeds up sample preparation.

To monitor catalyzer elements in pharmaceutical production according to forthcoming EU and US Pharmacopeia guidelines e.g., detection of sub-ppm catalyzer elements present in additives and active pharmaceutical ingredients (API).

High Performance TXRF Spectrometer for Ultra-Trace Element Analysis

30 mm quartz discs: elemental analysis of liquids, solids and suspensions.2” wafers: contamination analysis, depth profiling and material sciences research.Microscopy slides: clinical and biological samples, direct analysis of cell cultures, smears and thin sections.Rectangular carriers: with a size of up to 54 mm for films, filters, and nanoparticle layers. Any customized reflective media.