Topographic Raman Imaging: WITec TrueSurface Microscopy

WITec’s TrueSurface microscopy module introduced topographic Raman imaging to the marketplace. It uses an advanced optical profilometer integrated within the instrument to trace the surface of even roughly-textured or heavily-inclined samples during 3D molecular characterization. This combination of profilometry and Raman spectral acquisition ensures that measurements maintain optimum focus along the surface or at a set distance below while requiring minimal, if any, sample preparation.

As the sensor actively monitors data acquisition with sub-micrometer resolution, its closed-loop operation can compensate for any variations in temperature or humidity during measurements with long integration times, resulting in perfectly sharp and detailed images. Both the profilometry and Raman measurements are acquired through the same optical axis for fast and convenient one-pass operation.

Investigations on pharmaceutical tablet coatings, geological samples, composite emulsions, semiconductors and many other applications can benefit from TrueSurface.

Key Features

One-pass simultaneous optical profilometry and Raman imaging

3D chemical characterization on coarsely-textured or inclined samples

No specialized sample preparation

Closed-loop operation eliminates variations during long measurements

Data acquisition from a surface, or from a set offset distance

Topographic Raman microscopy image of micro-structured silicon.Image Credit: WITec GmbH

Topographic Raman microscopy image of a pharmaceutical tablet with corresponding spectra.Image Credit: WITec GmbH

Topographic Raman microscopy image of cellulose fibers.Image Credit: WITec GmbH