Thermo Scientific MagnaRay Wavelength Dispersive Spectrometer

The Wavelength Dispersive Spectroscopy (WDS) provides spectral resolution as an order of magnitude higher than Energy Dispersive Spectroscopy on Scanning Electron Microscopes (SEM/EDS). Students of EDS are aware that certain X-ray energy values can be in disagreement with other values. A classic example is tungsten with an M-line at 1.744 and silicon with a K-line energy of 1.740. This issue is referred to as "overlapping peaks." Another benefit is the method’s sensitivity to trace and light elements.

Found for several years in electron beam microprobes which array several WDS detectors around sample interaction with an electron beam, more recently WDS has been available on the scanning electron microscope. One disadvantage to WDS with its one detector is the duration of time it took to gather data.

The MagnaRay WD spectrometer was launched as a new and highly efficient method for the SEM. Using unique X-ray optics and automated operation, the MangaRay spectrometer makes WDS as simple to use and efficient as SEM/EDS, answering several problems that EDS cannot resolve.

MagnaRay WDS Features

Energy resolution of ∼ 4 eV

Clearly handles numerous peak overlaps that EDS cannot easily separate

Background values 20x lower than EDS

Greater sensitivity in quantitative analysis

Enhanced trace element detection

Highly Valuable in these Uses

Better spectrum quality

WDS-based Element Mapping

Element confirmation – quick Yes/No on element presence

Full standards WDS quantification for highest sensitivity and accuracy

Easy to Use

Includes energy range from 150 eV to 15 keV

Software automatically chooses the ideal diffractor crystal

Software performs auto-alignment to guarantee optimal performance