TXRF Spectrometer for Ultra-Trace Element and Contamination Analysis
The S2 PICOFOX from Bruker Nano Analytics is a transportable TXRF spectrometer available for the ……...

The potential to solder and wire bond is a crucial factor during the manufacture of reliable semiconductor packaging components and PCBs. Every miss-bonded component falls on the reject pile, either at the manufacturers’ plants or at their customers’ facilities.
Conventional methods, such as ESCA/Auger, SEM, Dip and Look, XRF, etc., tend to be costly, subjective, time intensive and are generally unreliable. Using the patented method, called Sequential Electrochemical Reduction Analysis (SERA), the SURFACESCAN® QC-100 from ECI Technology quantifies the adhesion properties of the surface. Users can check if they are ready for bonding and if not, they will know why.
The SURFACESCAN® QC-100 is a quick and low cost process and quality control tool that reveals the four significant reasons for rejects.
Key Features
Can analyze Ag, Cu, Co, Ni, Au, In, Sn, Bi, Pband Sb
Includes a corrosion-resistant test stand
Excellent for gold, copper, immersion tinand solder
Examines boards up to 15″x24″ (bigger sizes are optional)
Maintenance is low
A sealed reservoir is available for test solutions
Beam alignment for SMT or PHT pad positioning on the stand
Pre-programmed applications for numerous alternative surface finishes
Live surface fingerprint data-driven decision assists tools for review and troubleshooting of any abnormalities
Key Benefits
Coating Contamination
Detects possible issues on surface mount pads (SMT), plated through holes (PTH), lead framesand components
Non-destructive method eliminates sample preparation
Coating Uniformity
Exhibits coating thickness down to approximately 15Å
Detects and helps avoid oxidation to the underlying substrate
Immersion gold, copper oxide, tin, silver, nickel, or organic solderability preservative (OSP) coating porosity
Sn-Cu Intermetallic
The Tin Copper intermetallics are naturally brittle, causing a fracture in the solder. The QC-100 can identify and quantify the thicknesses of both Cu3Sn and Cu6Sn5
Technical Specifications
Conforming standards: NFPA and CE
Dimensions: 330 (13″) width x 445 (18″) height x 419 mm (17″) depth
Data communication: Multiple communication protocols such as Serial, RS-232, TCP/IP, and SECS/GEM
The S2 PICOFOX from Bruker Nano Analytics is a transportable TXRF spectrometer available for the ……...
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