The IM4000: An Argon-Based Ion Milling System

The IM4000Plus broad Ar⁺ ion milling system (BIB) from Hitachi is suitable for cross-sectioning or polishingof hard, soft, porous, compositeand heat sensitive materials and delivers perfect results.

Reliable High-Performance Milling

High current Ar⁺ beam allows quick and consistent cross-sectioning

Stable low kV (<1 kV) capability for sensitive materials

Suitable for final polishing, for example, for EBSD, utilizing low-angle milling (FlatMilling), or for contrasting by high-angle milling (relief milling) in just a few minutes

Image Credit: Hitachi High-Tech Europe

Easy Specimen Handling

Milling position can be readjusted at any time without remounting the specimen

Ex-situ alignment of mask and specimen makes setup fast and easy

Resin-embedded samples of up to 50 mm in diameter and 25 mm in height can be loaded for ultimate polishing

Simple Operation and Maintenance

Minimum and easy parameter settings for all types of applications or samples

Single ion beam gun allows easy setup and maintenance

Uniform, high-intensity ion beam throughout the complete voltage range, with separate acceleration voltages and ionization

Easy End-Point Detection

Real-time milling can be observed with the stereomicroscope

Extendibility

Cryo cooling can be added for heat sensitive materials

Vacuum transfer can be added for oxidation sensitive samples

Ion Milling System IM4000Play

Video Credit: Hitachi High-Tech Europe

Image Credit: Hitachi High-Tech Europe

Image Credit: Hitachi High-Tech Europe

Image Credit: Hitachi High-Tech Europe

Image Credit: Hitachi High-Tech Europe

Image Credit: Hitachi High-Tech Europe