The HF5000: A 200 kV Aberration-Corrected Transmission Electron Microscope

The HF5000 transmission electron microscope from Hitachi is a 200 kV aberration-corrected CFE TEM or STEM that provides a robust combination of atomic-resolution imaging and analysis, along with extensive automation and sophisticated in-situ capabilities.

Imaging Performance

With the fully automated C_s corrector, any kind of user can obtain quality results; alternatively, users can take complete manual control whenever they like

The power of atomic resolution SE imaging can be concurrently used with HAADF/ADF/BF

Field-free imaging of magnetic specimens in TEM and STEM mode

Ptychography and 4D STEM can be used to get the most out of samples

Image Credit: Hitachi High-Tech Europe

Analytical Performance

The high brightness and narrow energy CFE gun ensures optimal EELS performance

High throughput, high sensitivity EDX with symmetrically opposed dual SDDs offers a collection angle of more than 2 sr

Image Credit: Hitachi High-Tech Europe

Powerful Automation

With the help of the Azorus open-source software, multi-platform control systems and datasets can be brought together into a single timeline

Users can program their recipes and workflows in Python for regular tasks, tomography high speed acquisition, or the most complicated in-situ experiments

Advanced In-Situ Capabilities

In-situ and operando experiments can be performed with gas, liquid, biasing, heatingand electrochemistry holders

Customized holder design service allows users to undertake the required experiment

The SE detector helps observe in-situ reactions of gases with surfaces

Image Credit: Hitachi High-Tech Europe