TAMS: Total Absolute Measurement System

The Total Absolute Measurement System (TAMS) unit is the most versatile platform of its type, allowing users to select the best detector for angular-dependent measurements of optical characteristics of thin and thick materials utilizing a concentric rotating stage for sample and detector. When used with the LAMBDA 850+ and 1050+ UV/Vis/NIR spectrometers, the upgraded TAMS system enables several types of detectors depending on the sample type and application.

TAMS retains the best accuracy with the most extensive wavelength range for angle-dependent measurement, regardless of the detector used. TAMS is a beneficial complement to any production lab charged with the measurement of transmission and absolute reflectance at various angles. It is commonly used in examining glazing found on architectural and automotive glass and photovoltaic cells in the solar power industry.

A fully automated goniometer capable of detecting bidirectional reflectance and transmittance as well as angular resolved scattering

Only the accessory is housed in the detector compartment

Separate detectors for reference and sample beams, both of them can be switched by the operator for alternative detector modules tailored for specific purposes

Angular resolution 0.01° for both sample and detector stages

Angular accuracy 0.02° degrees for both sample and detector stages

Angular range sample stage +/–180°

Angular range detector stage 15°–345°

Angular range in reflectance 7.5°– >80°, depending on sample size

Angular range in transmittance 5°– >80°, depending on sample size (sample–detector inter-reflections occur for angles < 5° that compromises the accuracy)

Sample size up to 150×150 mm with the standard sample holder (200 mm×180 mm with other means)

200 mm Rotating sample platform with M5 screw holes on a 25 mm×25 mm grid

Applications

Absolute measurement of directional Reflectance and transmittance

BRDF/BTDF measurements

Unique Flexible Detector Sets

Users can select the optimum detector set for each application.

Sphere detector sets for strongest accuracy (to collect all extra beams from thick and slightly curved materials, for example)

Standard Detector sets for maximum sensitivity (BRDF/BTDF scattering measurements)

Autosampler

When mounted in a TAMS accessory, the TAMS autosampler (completely automated and integrated into the TAMS user interface) can take measurements on a 6- inch wafer at various points. By inserting a container for 19×1- inch samples or 5×2- inch samples, multisampling is feasible. In addition, users can program user’s own holder into the autosampler.

Specifications

Source: PerkinElmer