Talos F200S G2 TEM - High-Resolution Characterization and EDS Analysis

上海仪舶实验室自动化 25-01-23 14:00:29

Talos F200S G2 TEM - High-Resolution Characterization and EDS Analysis

Thermo Scientific's Talos F200S (S)TEM is a (scanning) transmission electron microscope that offers industry-leadingenergy-dispersive X-Ray spectroscopy (EDS) and exceptional high-resolution STEM and TEM images. High throughput STEM imaging, excellent adaptability, accurate EDS analysis, and high-resolution TEM (HRTEM) for dynamic microscopy are all made possible by the Talos F200S (S)TEM.

Talos F200S G2 Transmission Electron Microscope Advantages

Dynamic microscopy applications are made possible by the Thermo Scientific Talos F200S 200 kV (S)TEM, which combines rapid, multichannel, high-resolution (S)TEM imaging with accurate compositional analysis. In academic, government, and industrial research environments, the Talos (S)TEM is perfect for advanced research and analysis thanks to its innovativefeatures that boost throughput, precision, and user-friendliness.

Talos F200S G2 Transmission Electron Microscope Features

Intuitive Software

Features Velox software from Thermo Scientific for rapid and simple acquisition and evaluation ofmultimodal data.

Upgrade

Field upgradeable to the Thermo Scientific Talos F200X (S)TEM.

Precise Chemical Composition Data

With the use of two exceptionally clean in-column Thermo Scientific SDD Super-X detectors, rapid, accurate, quantitative EDS analysis may be performed to show nanoscale features.

Increased Stability

Reduced environmental sensitivity thanks to the instrument enclosure, which moderates the impact of air pressure waves, air flows, and subtle temperature fluctuations in the TEM room.

Better Image Data

Superior contrast for high-quality images is achieved throughhigh-throughput (S)TEM imaging withsimultaneous multiple signal detection.

Space For More

For dynamic tests, include application-specificin situ sample containers.

Product Specifications

Source: Thermo Fisher Scientific – Electron Microscopy Solutions

. .
HRTEM line resolution
  • 0.10

  • HRSTEM [nm]
  • 0.16

  • Total beam current FEG
  • >150 nA

  • EDS system
  • 2 SDD windowless design, shutter-protected

  • EDS energy resolution
  • ≤136 eV for Mn-Kα and 10 kcps (output)

  • Fast EDS mapping
  • Pixel dwell times down to 10 μs

  • EDS Net solid angle
  • 0.45 sr

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