Spectroscopic Ellipsometers 相关文章
  1. J.A. Woollam alpha-SE Spectroscopic Ellipsometer

    J.A. Woollam alpha-SE Spectroscopic Ellipsometer

    For routine measurements of thin film thickness and refractive index, the alpha-SE® is a great solution. Designed for ease-of-use: simply mount a sample, choose the model that matches your film……

    仪器产品 2025-02-05

  2. Ellipsometric Spectra Analysis at the Time of Layer Deposition - inSE-1000

    Ellipsometric Spectra Analysis at the Time of Layer Deposition - inSE-1000

    The inSE-1000 is the new in situ Spectroscopic Ellipsometer launched by Semilab. This tool provides rapid access to layer thicknesses and optical properties through ellipsometric spectra analysis d……

    仪器产品 2025-02-05

  3. Cost-Effective Non-Destructive and Non-Contact Optical Measurements on Substrates - SE-1000

    Cost-Effective Non-Destructive and Non-Contact Optical Measurements on Substrates - SE-1000

    Semilab’s SE-1000 spectroscopic ellipsometer is a high-performance, efficient and cost-effectivetabletop footprint. Ellipsometers are highly versatile tools for non-destructive and non-contac……

    仪器产品 2025-02-05

  4. J.A. Woollam M-2000-Series Spectroscopic Ellipsometers

    J.A. Woollam M-2000-Series Spectroscopic Ellipsometers

    The M-2000 line of spectroscopic ellipsometers is engineered to meet the diverse demands of thin film characterization. An advanced optical design, wide spectral range, and fast data acquisitio……

    仪器产品 2025-02-05

  5. J.A. Woollam IR-VASE Spectroscopic Ellipsometer

    J.A. Woollam IR-VASE Spectroscopic Ellipsometer

    The IR-VASE® is the first and only spectroscopic ellipsometer to cover the spectral range from 2 to 30 microns (333 to 5000 wavenumbers). The IR-VASE can determine both n and k for materials ov……

    仪器产品 2025-02-05

  6. J.A. Woollam IR-VASE Spectroscopic Ellipsometer

    J.A. Woollam IR-VASE Spectroscopic Ellipsometer

    The IR-VASE® is the first and only spectroscopic ellipsometer to cover the spectral range from 2 to 30 microns (333 to 5000 wavenumbers). The IR-VASE can determine both n and k for materials ov……

    仪器产品 2025-01-23

  7. J.A. Woollam M-2000-Series Spectroscopic Ellipsometers

    J.A. Woollam M-2000-Series Spectroscopic Ellipsometers

    The M-2000 line of spectroscopic ellipsometers is engineered to meet the diverse demands of thin film characterization. An advanced optical design, wide spectral range, and fast data acquisition ma……

    仪器产品 2025-01-23

  8. J.A. Woollam alpha-SE Spectroscopic Ellipsometer

    J.A. Woollam alpha-SE Spectroscopic Ellipsometer

    For routine measurements of thin film thickness and refractive index, the alpha-SE® is a great solution. Designed for ease-of-use: simply mount a sample, choose the model that matches your film……

    仪器产品 2025-01-23

  9. SE-1000 - Cost-Effective Spectroscopic Ellipsometry for Thin Film Characterization

    SE-1000 - Cost-Effective Spectroscopic Ellipsometry for Thin Film Characterization

    Semilab’s SE-1000 spectroscopic ellipsometer is a flexible and high-performance characterization tool in an efficienttabletop footprint. Ellipsometers are incredibly useful for non-destructiv……

    仪器产品 2025-01-23

  10. inSE-1000 - In Situ Spectroscopic Ellipsometer

    inSE-1000 - In Situ Spectroscopic Ellipsometer

    Semilab’s inSE-1000 is the new in situ Spectroscopic Ellipsometer on the market. This tool offers fast access to optical properties and layer thicknesses through ellipsometric spectra analysi……

    仪器产品 2025-01-23

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