Secondary Ion Mass Spectrometry (SIMS) 相关文章
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    AutoSIMS: Automatic Surface Analysis System

    The Hiden AutoSIMS is a self-contained, automated, SIMS tool designed to perform routine and repetitive surface analysis. It is perfect for the measurement of thin films, contamination and doping f……

    仪器产品 2025-03-16

  2. SC Ultra High Performance Magnetic Sector SIMS from CAMECA

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    The CAMECA SC Ultra has been specifically designed to meet the increasing needs for dynamic SIMS measurements in advanced semiconductors. The design of the CAMECA SC Ultra is quite unique: along wi……

    仪器产品 2025-01-23

  3. IMS 1280 Ultra High Sensitivity Magnetic Sector SIMS from CAMECA

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    The CAMECA IMS 1280 belongs to a new generation of SIMS instruments specifically designed to perform direct in situ analyses in selected µm-size areas of complex geological samples. A large r……

    仪器产品 2025-01-23

  4. NanoSIMS 50/50 L SIMS Microprobe from CAMECA

    NanoSIMS 50/50 L SIMS Microprobe from CAMECA

    The CAMECA NanoSIMS 50 is a unique ion microprobe optimizing SIMS analysis performance at high lateral resolution. It is based on a coaxial optical design of the ion gun and the Secondary ion extra……

    仪器产品 2025-01-23

  5. MAXIM Quadruple SIMS Analyzer from Hiden

    MAXIM Quadruple SIMS Analyzer from Hiden

    The Hiden MAXIM quadruple SIMS analyzer is a system for dynamic and static SNMS and SIMS applications. This analyzer is a state of the art secondary ion mass spectrometer for negative and positive,……

    仪器产品 2025-01-23

  6. ToF-qSIMS Workstation: Combining Time-of-Flight and Quadrupole Analyzers in a Single SIMS Instrument

    ToF-qSIMS Workstation: Combining Time-of-Flight and Quadrupole Analyzers in a Single SIMS Instrument

    The ToF-qSIMS Workstation from Hiden Analytical uniquely integrates both quadrupole and time-of-flight analyzers in a single SIMS instrument. The surface is the place where materials interact with ……

    仪器产品 2025-01-23

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