t-EBSD Detector for Crystallography and Pseudo-Symmetry Analysis

上海仪舶实验室自动化 25-01-23 12:47:05

t-EBSD Detector for Crystallography and Pseudo-Symmetry Analysis

Bruker’s latest eFlashHD detector has a CCD resolution of almost 2 MP, which is equivalent to 1600 x 1200 pixels, and modern camera optics to minimize distortions. The eFlashHD detector offers high definition Kikuchi patterns, which exhibit the finest details.

The datasets that contain eFlashHD high quality patterns are also suitable for cross correlation analysis using third party software such as CrossCourt4.

The eFlashHD has an improved cooling system compared to its predecessor eFlash HR. The enhanced cooling system helps to produce superior quality Kikuchi patterns.

The eFlashHD detector uses a high quality and high efficient phosphor screen for acquiring very detailed Kikuchi patterns. The combination of a small grain size phosphor material with a high pixel resolution CCD chip assures a final pixel size. The final pixel size in the patterns is 20 µm and this makes the extremely small shifts in patterns visible.

The eFlashHD’s high precision guiding system allows screen position precision which is over 10 µm. The eFlashHD is presented with ARGUS™ forescattered/backscattered electron imaging system, which helps to further increase the flexibility of the detector.

The eFlashHD uses the OPTIMUS™ TKD detector head to analyze electron transparent samples in the finest sample-detector geometry possible.

Key Features

The main features of the eFlashHD detector are as follows:

Produce Kikuchi patterns with superior signal/noise ratio

Offers valuable extra information for efficient and meaningful microstructure characterization

Enhanced cooling system reduces the CCD’s dark current by a factor of four

Can be retrofitted with distinct OPTIMUS™ TKD detector head

Applications

The main applications of the eFlashHD detector are as follows:

Ultra-accurate phase identification

Ideal for HR-EBSD/residual strain analysis

Analysis of pseudo-symmetry in crystal structures

Ideal solution to run the pattern center calibration with techniques that are based on screen movement

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