美国LECO Corporation
1936年,实验室设备公司(Laboratory Equipment Company)为美国钢铁行业推出了第一台快速碳测定仪。75年……...
The SmartSPM Scanning Probe Microscope available from HORIBA Scientific is the first fully automated instrument that provides its innovative technology of ultra-fast, metrological and high-resolution measurements for the most sophisticated materials research at the nanoscale in all STM and AFM modes.
With the SmartSPM capable of zooming in from large up to 100 µm, it has been feasible to realize overview scans down to atomic resolution. It has been designed such that it can be easily combined with optical spectroscopies (Raman, SNOM, Photoluminescence, and TERS/SERS methods).
Key Features
Automation of Operation/Ease of Use
Completely automated laser to photodiode alignment (user click-on-spot is not needed)
Swapping of probes is easier than ever before
Very fast system tuning prior to starting measurements
Completely automated configuration for the most standard AFM modes
Resolution/Stability/Accuracy
Vibration isolation is not required for basic measurements
A single 100 µm scanner delivers large scans as well as goingdown to atomic or molecular resolution
The lowest noise closed-loop sensors can be used even during molecular resolution imaging to obtain the most precise results
Fast Scanning
Scanner resonant frequencies of >7 kHz in XY and >15 kHz in Z are the highest in the current AFM sector
Enhanced scanner control algorithms enable scanning much faster than ever before
All SPM Modes Included as well as Nanolithography with no Extra Units and Costs
Kelvin probe microscopy, nanolithography, piezoresponse force microscopy, and nanomanipulation are all added into the basic package
Flexibility to Upgrade to AFM-Raman
The SmartSPM has been engineered from the ground upfor appropriate and easycoupling with Raman systems
1936年,实验室设备公司(Laboratory Equipment Company)为美国钢铁行业推出了第一台快速碳测定仪。75年……...
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