Scanning Probe Microscope (SPM) - Innova from Bruker

The Innova atomic force microscope from Bruker provides high resolution imaging and a broad range of functionality for application flexibility at a moderate cost - ideal for research use in life sciences, materials, and physical studies.

The proprietary closed-loop scan delivers noise-levels that approach those of high-end, open-loop systems and offers a wide range of functionality for physical, materials, and life sciences, from sub-micron levels up to 90 microns.

Features

Features of the bruker Innova SPM include:

Exclusive Whisper™ piezo scan technology delivers AFM performance and resolution second only to the Bruker MultiMode

Highest resolution optics deliver better data and accurate probe positioning

Fast tip exchange and superior sample access offer convenience and exceptional ease of use

Full range of SPM modes provides powerful research flexibility

Advanced signal access and routing capabilities for custom research

Now with Dark Lift™, which leverages Bruker's patented LiftMode capability, enabling you to distinguish between intrinsic electrical sample properties and photoelectric effects