SEM-Base® VI: Ultimate Vibration Solution for Advanced Microscopy
SEM-Base®VIisthe next generation in STACIS active piezoelectric vibration cancellation. SEM-B……...

The S neox Cleanroom represents a previously unheard-of technological turning point for optical metrology. It offers the most versatility within manufacturing settings.
With its four different light sources and four-in-one technology, the S neox Cleanroomoffers unmatched adaptability for shifting application requirements.

Image Credit Sensofar Metrology
It has been meticulously designed to be ISO Class 1 and ESD compatible.

Image Credit: Sensofar Metrology
Piezoelectric Z motor integration is an option for the S neox Cleanroom,improvingperformance. It also covers thicknesses between 50 nm and 5 mm.

Image Credit: Sensofar Metrology
Focus on the sample’s surface and the integrable head will automatically determine the best acquisition setting for any measurement with this equipmentwhen using the 3D Auto mode.

Image Credit: Sensofar Metrology
Objective Lenses
Table 1. Source: Sensofar Metrology
| Brightfield | Interferometry | |||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|
| MAG | 5X | 10X | 20X | 50X | 100X | 150X | 2.5X | 5X | 10X | 20X | 50X | 100X |
| NA | 0.15 | 0.30 | 0.45 | 0.80 | 0.90 | 0.95 | 0.075 | 0.13 | 0.30 | 0.40 | 0.55 | 0.70 |
| WD (mm) | 23.5 | 17.5 | 4.5 | 1.0 | 1.0 | 0.2 | 10.3 | 9.3 | 7.4 | 4.7 | 3.4 | 2.0 |
| FOV1 (μm) | 3378x2826 | 1689x1413 | 845x707 | 338x283 | 169x141 | 113x94 | 6756x5652 | 3378x2826 | 1689x1413 | 845x707 | 338x283 | 169x141 |
| Spatial sampling2 (μm) | 1.38 | 0.69 | 0.34 | 0.13 | 0.07 | 0.05 | 2.76 | 1.38 | 0.69 | 0.34 | 0.13 | 0.07 |
| Optical resolution3 (μm) | 0.94 | 0.47 | 0.31 | 0.18 | 0.16 | 0.148 | 1.87 | 1.08 | 0.47 | 0.35 | 0.26 | 0.20 |
| Measurement noise4 (nm) | 100 | 30 | 8 | 5 | 3 | 1 | PSI/ePSI 0.1 nm (0.01 nm with PZT) CSI 1 nm | |||||
| Maximum slope5 (º) | 9 | 17 | 27 | 44 | 64 | 72 | 4 | 7 | 17 | 24 | 33 | 44 |
System Specifications
Table 2. Source: Sensofar Metrology
| . | . |
|---|---|
| Measuring principle | Confocal, PSI, ePSI, CSI, Ai Focus Variation and Thin Film |
| Measurement types | Image, 3D, 3D thickness, profile and coordinates |
| Camera | 5 Mpx: 2448x2048 pixels (60 fps) |
| Confocal frame rate | 60 fps (5 Mpx); 180 fps (1.2 Mpx) |
| Vertical scan range coarse | Linear stage: 40 mm range; 5 nm resolution |
| Vertical scan range fine | Piezoelectric scanner with capacitive sensor: 200 μm range; 1.25 nm resolution |
| Max. Z measuring range | PSI 20 μm, ePSI 10 mm, CSI 10 mm; Confocal & Ai Focus Variation 34 mm |
| LED light sources | Red (630 nm); green (530 nm); blue (460 nm) and white (575 nm; center) |
| Nosepiece | 6 positions fully motorized |
| Sample reflectivity | 0.05% to 100% |
| Advanced Software Analysis | Inc: SensoVIEW; Op: SensoPRO, SensoMAP |
| Communication protocol | DLL; XML (optional) |
| Computer | Latest INTEL processor |
| Operating system | Microsoft Windows 10®, 64 bit |
| Cable Length | 3 m (5 m, 10 m optional) |
| Environment | Temperature 10 ºC to 35 ºC; Humidity <80% RH; Altitude <2000 m |
S neox Cleanroom sensor, the highest flexibility compatible with Cleanroom - Ads
Dimensions

Image Credit: Sensofar Metrology
1 Maximum field of view with 3/2” camera and 0.5X optics.2 Pixel size on the surface. 3 L&S: Line and Space, half of the diffraction limit according to the Rayleigh criterion. Spatial sampling could limit the optical resolution for interferometric objectives. Values for blue LED. 4 Measurement noise measured as the difference between two consecutive measures on a calibration mirror placed perpendicular to the optical axis. For interferometry objectives, PSI, 10 phase averages. The 0.01 nm are achieved with Piezo stage scanner and temperature-controlled room. Values for green LED (white LED for CSI). Values obtained in a VC-E vibration environment. 5 On smooth surfaces. Up to 86° on rough surfaces. 6 This is the weight of the sensor head with one objective in the turret.
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