BI-MwA Molecular Weight Analyzer for GPC/SEC Calibration
Characterization of dilute polymer solutions using static light scattering (SLS) is now easier an……...

The new QUALI-FILL® LIBRA online standalone metrology systems from ECI Technology have been specifically engineered to quantify material properties like Ni, Cu, SnAgand other crucial chemical species in plating solutions used for wafer packaging and other applications.
The QUALI-FILL® LIBRA system has a modular design and can be configured to fulfill users’ demands. Developed based on ECI’s established QUALI-FILL® chemical management platform, this sturdy system easily combines with R&D and production fabrications and is in compliance with the latest SECS/GEM and safety guidelines.
The QUALI-FILL® LIBRA K series takes metrology performance to an ultra-safe and ultra-clean wafer fabrication environment. It helps monitor plating chemicals used for wafer level packaging processes like TSV, RDL, UBMand Micro Bumping processes like fan-out, SOC, and others.
The QUALI-FILL® LIBRA A system has been developed for the tough settings of printed circuit board manufacturing. It is exclusively designed for analyzing plating chemicals in PLP and PCB manufacturing, like Electroplated Ni, Cu, Au, Pd, Snand Sn-alloys, as well as Electroless Ni, Cu, Pd, Auand Zincate.
The smart QUALI-DOSE system combines easily with QUALI-FILL LIBRA systems to accurately dose plating baths with replenishing solutions.
Breakdown products. Source: ECI Technology
| Process Solution | Contaminant | Analytical Technique |
|---|---|---|
| Cu | Suppressor BP | SBP, ST-based, TOC |
| Accelerator BP | DPA, ABP, AABP, HPLC | |
| Leveler BP | DPA-C CVS | |
| Cu(I) | DPA-C | |
| H2O2 | CVS | |
| PR/contaminant | Spectroscopy/Titration | |
| Metal contaminants: Sn, Ni, Co, Au | ICP | |
| Sn and SnAg | PR/contaminant (SnIV) | Spectroscopy/Titration |
| Metal contaminants: ICP Cu, Ni, Co, Au | ICP | |
| Ni, Co | PR/contaminant | Spectroscopy |
| Metal contaminants: Cu, Sn, Au | UV-Vis for Cu, ICP for Sn and Au | |
| Leveler BP in Atotech chemistry | UV-Vis | |
| Au | Metal contaminants: Cu, Ni, Co, Sn | UV-Vis for Cu, ICP for Sn and Au |
Main Features
Versatile, modular design supports various types of manufacturing lines
Includes several analytical techniques to find and quantify the concentrations of crucial chemical species
Parallel close-loop integration to several plating process tools
Parallel analysis of various chemistries
Users can communicate with fabrications CIM via SECS/GEM
Multiple tanks can be supported for each chemistry
Main Benefits
The main advantages of the QUALI-FILL LIBRA analyzers are their patented and proprietary methods to detect and quantify contaminants like photoresist, additive by-productsand trace foreign metals. Such contaminants have an impact on the plating results and are crucial to managing the quality of the plated products.
The system monitors and allows process understanding of control process solutions and waste streams for treatment or recycling
Intelligent dosing capabilities help tighten the process
Unprecedented repeatability and accuracy can be ensured by using minimal, cost effective reagent solutions. High value analyses can be performed with low consumables and low cost per analysis.
ECI offers fast development times for brand new chemistries
Flexible configurations with an extensive range of applications
Technical Specifications
Conforming standards: CE, NFPA-79, SEMI F47, SEMI S2-S8, KRWA
Dimensions:
1 cabinet: 762 mm (30″) W x 2064 mm (81.2″) H x 610 mm (24″) D
2 cabinets: 1524 mm (60″) W x 2064 mm (81.2″) H x 610 mm (24″) D
3 cabinets: 2286 mm (90″) W x 2064 mm (81.2″) H x 610 mm (24″) D
AC: 180 to 245 VAC, 50/60 Hz, 15 A
Data communication: Multiple communication protocols— TCP/IP, Serial, SECS/GEM, RS-232

Image Credit: ECI Technology
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