QUADRO Detector Series from DECTRIS

The latest QUADRO detector introduced by DECTRIS has been developed to offer excellent performance to materials science Transmission Electron Microscopy (TEM) without impacting sensitivity, speed, or precision. It delivers up to 18,000 frames/second readout and 24-bit high dynamic range, without binning or gimmicks!

The QUADRO detector is powered by DECTRIS’ latest EIGER2 ASIC (Application Specific Integrated Circuit), fully developed by the company. It includes everything which made DECTRIS’ detectors perfect for the most challenging X-ray applications — continuous readout, hybrid pixel technology, instant retrigger, and noise-free acquisition.

The QUADRO is a direct electron detector that uses hybrid pixel technology in which the finest readout chip is matched with the most appropriate sensor material to offer improved sensitivity (DQE) for users’ applications.

In addition, dedicated in-pixel electronics enable single electron counting even at extremely high count-rates, that is, up to 10 million electrons/pixel/second. Users can adjust the sensor material according to the energy range of their applications. The QUADRO comes with CdTe for mid-to-high-energy electrons (120–300 kV) or a silicon sensor for low energies (30–200 kV).

The DECTRIS QUADRO detector can be used with the SerialEM program and an array of transmission electron microscopes. It is fully incorporated into NanoMegas' TopSpin application.

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Orientation Mapping with an Aluminum sample

Figure 1. Orientation mapping results from diffraction patterns acquired with QUADRO. From left to right: Color-coded orientation map with grain boundaries, orientation reliability map, and index map. Image Credit: DECTRIS.

Key Advantages

No dead time

Up to 18,000 frames/second

10⁷ counts/pixel/second

Region of interest feature

Direct detection of electrons

Optimal DQE even at low energies

Noise-free electron counting

Beam stop is not needed

Applications

Lorentz, magnetic mapping

Strain mapping

Dynamic TEM

In-situ TEM

4D-STEM

Ptychography

Electron diffraction

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QUADRO Specifications

Table 1. Source: DECTRIS

All specifications are subject to change without notice.