QA-QC and Academic X-Ray Diffractometer - ARL EQUINOX 100

上海仪舶实验室自动化 25-01-23 14:21:19

QA-QC and Academic X-Ray Diffractometer - ARL EQUINOX 100

TheThermo Scientific™ ARL™ EQUINOX 100 is an X-Ray diffractometer (XRD) designed for structural and phase analysis in industrial and research settings. For routine analysis, dynamic investigations, formulation determinations, and teaching in universities and colleges, the bench-top design is the best and most cost-effective solution.

The ARL EQUINOX 100 XRD incorporates a unique curved position sensitive detector (CPS) that enables real-time simultaneous full pattern capture, which acceleratesin situ investigations, crystalline phase development, and phase transitions.

Standard power source; no need for extra water cooling

Robust and reliable without any moving components

High intensity from a microfocus source with little power

Real-time simultaneous data acquisition

Adaptable sample entry and analysis

Improve sample representativeness by measuring transmission and reflection

Reliable and Robust

The ARL EQUINOX line from Thermo Scientific is designed to be used in production control, mobile, and central laboratories, among other types of labs. This X-Ray diffraction (XRD) technology respondsto operations with greater speed and adaptability.

No moving parts: stationary X-Ray source and detector

Fixed focal length: no need for realignment

Asymmetric mode acquisition across 110˚2θ

Adaptable angle of incidence for the sample

Perfect for measurements of small angles

ARL EQUINOX 100 geometry: Asymetric mode with a Position Sensitive Detector for real time XRD acquisition.

ARL EQUINOX 100 geometry: Asymmetric mode with a Position Sensitive Detector for real-time XRD acquisition. Image Credit: Thermo Fisher Scientific - Elemental and Phase Analysis​​​​​​​

Flexible Instrument

High Intensity from Low-Power Microfocus Source

Extremely brilliant rays are generated bymicrofocus X-Ray sources, which arelow-power X-Ray tubes.This arrangement collects and concentrates incidence scattered X-Rays via a mirror system. Even at low power, the X-Ray flux diffracting the sample is substantially greater than with traditional systems.

X-Ray flux close to a standard X-Ray source

Focusing mirror for higher intensity

Mirrors capture and focus X-Rays onto samples for better efficiency

Beam size: approximately 5 mm×300 µm

Focusing beam geometry

Acquisition at low angle on Silver behenate powder recorded in reflection mode.

Acquisition at low angle on Silver behenate powder recorded in reflection mode. Image Credit: Thermo Fisher Scientific - Elemental and Phase Analysis​

Versatile Sample Entry and Analysis

The most adaptable benchtop XRD instrument on the market, the ARL EQUINOX 100 XRD can measure reflection or transmission in a range of sample types and analytical conditions. It only takes a few seconds and requires no adjustments to switch sample holders. The following are the accessory phases:

Fixed non-spinning sample stage

Single-position spinning stage for reflection and transmission

Reflection mode spinning stage with height adjustment

Controlled atmosphere reflection sample stage

Capillary transmission sample stage

Six-position automatic sample changer with spinning stages

GIXRD thin layer analysis stage

Temperature-controlled stage

Real-Time Simultaneous Data Acquisition

CPS real-time detectorsare unique acquisition tools thatsimultaneously gather all of the diffraction data. These detectors carry out real-time diffraction studies on powders, bulk materials, and thin films, enabling rapid analysis as well as dynamic study.

Studies and Applications

Dynamic Studies

Phase transition at high-temperature

Phase transition at high temperature. Image Credit: Thermo Fisher Scientific - Elemental and Phase Analysis​

Real-time dynamic crystallographic measurements are essential for understanding how a material's properties change with temperature, pressure, environment, and other variables. Real-time capture of structural phase transitions or material changes is possible with position-sensitive detectors (PSD).

It might be especially challenging to ensure that no transition is missed during a measurement when working with unstable substances. The entire XRD diffractogram is concurrently gathered by the PSD.

Thin Film Applications

Grazing incidence measurement: Observation of an interference with the substrate peak

Grazing incidence measurement: Observation of an interference with the substrate peak. Image Credit: Thermo Fisher Scientific - Elemental and Phase Analysis​

Thin film material analysis with the ARL EQUINOX 100 XRD is made easy and accurate by its specially designed sample platform.

Grazing incidence GIXRD identifies the phases, texture, and structure of a thin crystallized deposit on a substrate, whereas reflectometry (XRR) evaluates the type, thickness, and roughness of film deposits at interfaces.

Samples and Attachments

Fixed Sample Stage

QA-QC and Academic X-Ray Diffractometer - ARL EQUINOX 100

Image Credit: Thermo Fisher Scientific - Elemental and Phase Analysis​

Stationary sample mount for powders, solids, or samples on a glass plate

Reflection or transmission mode

Sample position aligned by positioning screw

Spinning Stage for Powder Sample

QA-QC and Academic X-Ray Diffractometer - ARL EQUINOX 100

Image Credit: Thermo Fisher Scientific - Elemental and Phase Analysis​

Reflection and transmission mode on powder

Continuous sample rotation

Zero background holder for micro-quantity samples

Special cups to protect air-sensitive samples

Spinning Stage with Height Adjustment

QA-QC and Academic X-Ray Diffractometer - ARL EQUINOX 100

Image Credit: Thermo Fisher Scientific - Elemental and Phase Analysis​

Reflection mode on powder and bulk

Sample maximum size: 40×20 mm with a centered sample

Height adjustment to 30 mm

Continuous sample rotation

Spinning Stage for FilterStudies

QA-QC and Academic X-Ray Diffractometer - ARL EQUINOX 100

Image Credit: Thermo Fisher Scientific - Elemental and Phase Analysis​

Specific measurement in reflection mode on filter

Continuous sample rotation

Available with silver membrane filter (25 mm diameter)

Spinning Stage for Pressed Pellets

QA-QC and Academic X-Ray Diffractometer - ARL EQUINOX 100

Image Credit: Thermo Fisher Scientific - Elemental and Phase Analysis​

Reflection mode for pressed samples like cement

Continuous sample rotation

Choice according to customer’s specifications

51 mm steel rings

40 mm steel rings or free pressed

Sample Stage with Controlled Atmosphere

QA-QC and Academic X-Ray Diffractometer - ARL EQUINOX 100

Image Credit: Thermo Fisher Scientific - Elemental and Phase Analysis​

Reflection mode for powder

Continuous sample rotation

Modes of operation

Fully isolated cell with closed connections

Gas control in the cell

Gas circulation to recycle atmosphere

Capillary Stage for Transmission Measurement

QA-QC and Academic X-Ray Diffractometer - ARL EQUINOX 100

Image Credit: Thermo Fisher Scientific - Elemental and Phase Analysis​

Transmission mode on sample in capillary

Goniometric head support

Continuous sample rotation

Borosilicate or quartz capillaries available with a diameter from 0.1 to 3.5 mm

Automatic 6-Position Sample Changer

QA-QC and Academic X-Ray Diffractometer - ARL EQUINOX 100

Image Credit: Thermo Fisher Scientific - Elemental and Phase Analysis​

Six sample positions in reflection mode

Continuous sample rotation

Zero background holder available

Thin Layer Attachment

QA-QC and Academic X-Ray Diffractometer - ARL EQUINOX 100

Image Credit: Thermo Fisher Scientific - Elemental and Phase Analysis​

Specific attachment for thin film application

Sample size up to 25×25×10 mm

High accuracy motors in θ and Z adjustments

Excellent for GIXRD

X-Ray reflectometry (XRR)

Temperature Controlled Stage

QA-QC and Academic X-Ray Diffractometer - ARL EQUINOX 100

Image Credit: Thermo Fisher Scientific - Elemental and Phase Analysis​

BTS500: temperature range from ambient to 500 °C

BTS150: temperature range from –10 °C to 150 °C

Reflection mode

Sample conditioning in vacuum, air, or inert gas possible

Fast heating and cooling

Accurate temperature measurements by a thermos sensor close to the sample

10–1 mbar to 1 bar relative

Analytical Performance

The ARL EQUINOX 100 XRD can be used to swiftly and precisely analyze materials ranging from minerals to drugs. As the complete pattern is collected concurrently, the instrument boasts exceptional resolution and speed for a benchtop device. The ARL EQUINOX 100 XRD can be used to identify phases, calculate percentage crystallinity, and even solve crystal structures.

QA-QC and Academic X-Ray Diffractometer - ARL EQUINOX 100

Image Credit: Thermo Fisher Scientific - Elemental and Phase Analysis​

Thermo Scientific™ SolstiX™ XRD Software 21 CFR Part 11 Ready

QA-QC and Academic X-Ray Diffractometer - ARL EQUINOX 100

Image Credit: Thermo Fisher Scientific - Elemental and Phase Analysis​

Pharmaceutical companies can keep high-performance standards while producing compliantfindings with the ARL EQUINOX 100 X-Ray benchtop diffractometer by using Thermo Scientific SolstiX XRD Software with Security Suite. The software solutions satisfy the requirements of 21 CFR Part 11 regarding audit trails and electronic signatures.

Protect computer systems used by manufacturers to store electronic data related to quality assurance

Put safeguards in place to keep records true, incorruptible, and private

Electronic signatures enable users to bear responsibility for their electronic data in the system

Data records must include the date and time of the scan, unique signer name, and security mechanisms like passwords

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