Precision Transmission Electron Microscope: JEM-2100 Plus

上海仪舶实验室自动化 25-01-23 12:45:45

Precision Transmission Electron Microscope: JEM-2100 Plus

With a low cost of ownership, the JEM-2100 Plus Transmission Electron Microscope from JEOL is a versatile 200 kV LaB6 TEM that can be used for various tasks, from materials science to biological and medical research.

Remote operation and the integration of EDS, STEM, and EELS are made possible by the JEM-2100 Plus advanced control system. Its user-friendly operation also results in improved performance.

The "TEM Center" software condenses STEM operation, column controls, and camera operation onto a single screen for ease of use. This operation is easy to use and intuitive. With a single button press, the operator can easily choose from a wide variety of illumination modes.

The JEM-2100 Plus includes an optional bottom-mount camera called the "Matataki Flash" made by JEOL. It uses an advanced sCMOS sensor to capture images and diffraction patterns.

The JEM-2100 Plus has a goniometer stage of great stability specifically tuned for high-tilt tomographic applications. The x/y piezo stage is an additional choice.

Its three separate condenser lenses allow the microscope to optimize probe conditions for any given probe size, making it ideal for various applications such as EDX and NBD. This enables enhanced diffraction and analytical abilities, providing quality results effortlessly and swiftly.

The patented JEOL Alpha SelectorTM allows the user to choose from a variety of illumination conditions, such as full convergent beam or parallel illumination. The objective mini lens is a standard component of this microscope, indicating that Lorentz microscopy is one of its features. A high-contrast aperture is supplied for any polepiece selection, allowing for simultaneous EDS and high-contrast imaging.

For laboratory environments that are not suitable for rotary or oil-based pumps, the JEM-2100 Plus offers a full dry-pumped/turbo-pumped version and a variety of pumping options.

Precision Transmission Electron Microscope: JEM-2100 Plus

Image Credit: JEOL USA, Inc.

Key Features of the JEM-2100 Plus

A large selection of interchangeable objective lenses based on the needs of the application (HR, UHR, HC, HT, Cryo)

Crystallographic Micro Electron Diffraction option

With a guaranteed Point-Point resolution as low as 0.194 nm, the UHR Objective lens offers exceptional and effortless atomic/lattice imaging capabilities at less than 0.14 nm.

Fine probe analysis and nanobeam diffraction with probes smaller than 1 nm

Tomography-capable, offering an enormous tilt range (+80°) and the simplicity of operation needed to obtain 3D images

Cryo screening abilities

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