NEX CG II Cartesian-Geometry EDXRF Spectrometer

Rigaku’s NEX CG II is a robust and fast XRF spectrometer capable of extending the boundaries of EDXRF technology. It provides fast and non-destructive multi-element analyses (from sodium (Na) to uranium (U)), rangingfrom trace concentrations to percent levels.

The Cartesian configuration and indirect excitation increase the signal-to-noise ratio, even for complexsamples. This makes the NEX CG II an ideal solution for applications from industrial quality control to the most advanced research applications.

The NEX CG II is a flexible elemental analyzer that has been designed specially to provide fast qualitative and quantitative elemental analyses satisfying the needs of numerous industries. The system is suitable for chemical analysis in almost all matrices, ranging from oils and liquids to solids, metals, polymers, coatings, powders pastesand thin films.

Cartesian Geometry and Polarization for Trace Level Sensitivity

When compared to conventional energy dispersive X-ray fluorescence (EDXRF) spectrometers, the NEX CG II usesan indirect excitation that uses secondary targets rather than tube filters. The polarized and monochromatic excitation obtained from secondary targets significantly improves the detection limits for elements lying in high scattering matrices like water, hydrocarbonsand biological materials.

Since the secondary target excitation is in full 90º Cartesian Geometry, it helps eliminate the background noise. Thus, the NEX CG II offers a completely new grade of analytical sensitivity to XRF technology. The system is capable of performing ultra-low and trace element concentration measurement even on complicated sample types.

Key Benefits and Features

The system consists of a high-power 50 kV, 50 W X-ray tube

Capable of performing non-destructive elemental analysis ranging from sodium (Na) to uranium (U)

Fast elemental analysis of solids, liquids, powders, thin filmsand coatings can be performed

Executes indirect excitation for significantly lower detection limits

Comes with a large-area high-throughput silicon drift detector (SDD)

Features analysis capability in helium, vacuumor air

New RPF-SQX Fundamental Parameters software comes with Scattering FP

Various automatic sample changers can accommodate up to 52 mm samples

Comes with Rigaku Profile Fitting (RPF) advanced algorithm for peak deconvolution

Easy-to-use and strong QuantEZ^® software comprising a multilingual user interface

Offers low cost of ownership and two-year warranty

Rigaku NEX CG II Cartesian Geometry EDXRF SpectrometerPlay

Video Credit: Rigaku Corporation