NewView™ 9000: 3D Optical Surface Profiler

The NewView^TM 9000 3D optical surface profiler offers exceptional adaptability in non-contact applications. Measuring various surface types, such as smooth, rough, flat, sloped, and stepped, is effortlessly quick. These measurements are nondestructive and rapid, andsample preparation is not required.

The system's main component is ZYGO's Coherence Scanning Interferometry (CSI) technology, which maximizes return on investment by measuring a more comprehensive range of surfaces faster and more precisely than other commercially available technologies and delivering sub-nanometer precision at all magnifications.

Performance, Value, and Versatility

The NewView line of products from ZYGO is known for its flexibility. With applications ranging from step heights, thin films, uneven and wavy surfaces, and flatness to more, the NewView 9000 profiler provides outstanding value.

A triple-zoom turret that may be filled with individual zoom optics specifically designed for the system is a feature shared by all NewView 9000 profilers. Examples of staging configurations include fully automated setups with encoded travel and entirely manual setups.

NewView 9000 systems, in any configuration, provide rapid, easy-to-use, high-accuracy measurements at an affordable price, making them the best option for 3D optical profilers looking for versatility and value.

Among the unique features aimed at improving, speeding up, and enhancing consumers' metrology are:

A large-area, high-sensitivity 1.9 MP sensor allows for capturing more images in a single measurement.

High-speed measurements improve productivity and process control in a matter of seconds.

Automated part focus and setup reduce operator variability and training time while speeding up data collection.

Gage-capable performance for even the most exacting production applications.

SmartPSI^TM technology for ultra-fast profiling of ultra-smooth surfaces

Vibration-resilient metrology with SureScan technology and available built-in isolation offers high-quality metrology even in vibration-prone situations

2D and 3D correlation yields results that meet ISO 25178 and ISO 4287 standards, giving confidence in measurements.

Mx^TM software for measurement automation, analysis, and instrument control

Flexible Configurations

The wide workspace and clear lines of sight of the NewView 9000 profiler facilitate quick and easy measurement setups and changeovers. System sample staging options vary, ranging from manual X/Y and tilt stages to fully automated stages with 4º of tilt and 150 mm of motion.

It is ideally suited for benchtop installations due to its integrated isolation system and small size. Adding a workstation and optional stand makes it a production-style solution.

Image Credit: Zygo Corporation