Nano-Observer II: AFM for Nanoscale Imaging

The Nano-Observer II is a state-of-the-art Atomic Force Microscope (AFM) that blends remarkable performance, adaptability, and ease of use. It offers a range ofcapabilities for nanoscale imaging and characterization and is intended for both novice and expert users.

Nano-Observer II: Revolutionizing Nanoscale Research with Advanced AFM TechnologyPlay

Video Credit:CSInstruments

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Key Features

AutoScan Software: Easier and Faster Automated Scanning

Three clicks produces high-quality images

Electronic control and automated setup for more straightforward operation

Advanced users benefit from comprehensive functions and parameter settings

User-Friendly Design

Small AFM head with a system of pre-positioned tips

Simple optical path and sample access

The tip/sample area’s top and side views for an effective pre-approach procedure

Advanced Technology Integration

24-bit low-noise USB controller

Low noise integrated lock-in features that improve phase detection, EFM/MFM/KFM, or PFM

Advanced imaging modes include HD-KFM, ResiScope, and Soft Intermittent Contact (Soft-IC)

High-Performance Scanning

Low-noise, high-resolution scanning capabilities

Large-small area scans without changing the scan head

Consistent resolution across all scan sizes

Advanced Modes

ResiScope^™ III

Sample: Polymer battery. Mode: Soft ResiScope. Scan size: 60 microns Signal: Current from 2 pA to 3 µA. Image Credit: CSInstruments

Electrical resistance is measured across ten orders of magnitude (10²to 10¹²ohms)

High sensitivity for in-depth examination of the electrical characteristics of materials

Applications in advanced materials science, semiconductors, and photovoltaics

HD-KFM^™ III (High Definition Kelvin Force Microscopy)

Sample: Graphene. Mode: HD-KFM .Scan size: 20 microns. Image Credit: CSInstruments

Sample: Metallic structure embedded on epoxy. Mode: 1. Topography 2. HD-KFM dC/dZ Scan size. Image Credit: CSInstruments

Creates new benchmarks for mapping surface potential

Improved spatial resolution and sensitivity

Ideal for 2D materials, semiconductors, and polymers

Soft IC Mode - The 3rd AFM Mode

Blends dynamic potential of resonant modes with the accuracy of contact AFM

Ideal for delicate and soft materials

Detailed mechanical and electrical measurements with minimal sample disturbance

Includes Soft Meka, Soft PFM, Soft ResiScope and Soft SThM

Soft MEKA

Soft IC mode extension for accurate mechanical property measurements

High-resolution mapping of stiffness and adhesion

Particularly useful for soft or fragile samples

Soft PFM

Integrates Piezoresponse Force Microscopy (PFM) with Soft IC

Simultaneous mechanical and electrical measurements

Perfect for thorough material analysis with little effect on the sample

Soft SThM Mode

Soft IC mode extension for accurate thermal property measurements

Application Fields

Photovoltaics

Electrochemistry

Corrosion Studies

Nanomechanical Analysis

Materials Science

Semiconductor Research

Polymer Studies

Biological Samples

2D Materials Characterization

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