Nano Indenter® - G200

The KLA Instruments™ Nano Indenter® G200 is the world’s most accurate, flexible, and user-friendly instrument for nanoscale mechanical testing. Electromagnetic actuation allows it to achieve unparalleled dynamic range in force and displacement. The Nano Indenter G200 enables users to measure Young’s modulus and hardness in compliance with ISO 14577. It also enables measurement of deformation over six orders of magnitude (from nanometers to millimeters). A variety of available options can be added to accommodate testing needs.

The capabilities of the Nano Indenter G200 can be extended to facilitate frequency-specific testing, quantitative scratch and wear testing, integrated probe-based imaging, high-temperature testing, expanded load capacity up to 10 N, and customizable test protocols. Users are able to quantify the relationship between structure, properties, and performance of their materials quickly and easily with minimal sample preparation.

The Nano Indenter G200 standard configuration utilizes the KLA Instruments XP indentation head, which delivers < 0.01nm displacement resolution and > 500µm maximum indentation depth. To extend the range of load-displacement experimentation to the surface contact level, the system can be equipped with the Dynamic Contact Module (DCM). With this option, researchers can study not only the first few nanometers of an indentation into the surface of a material, but even the pre-contact mechanics. The DCM has the lowest noise floor of any instrument of its type.

Key features of the Nano Indenter G200 include:

Affords researchers 100mm x 100mm useable surface area for testing

Electromagnetic actuation allows unparalleled dynamic range in force and displacement

Flexible, upgradeable nanoindentation instrument can be configured for many applications

High Load option expands load capabilities of nanoindenter up to 10 N of force

DCM II option offers 3x higher loading capability than the original DCM option

LFM option provides 3D quantitative analysis for scratch and wear testing, MEMS probing

Performance capabilities of the Nano Indenter G200 are as follows:

Semiconductor, thin films, MEMS, hard coatings, DLC films, metals, ceramics, composites

Also ideal for use in applications involving polymers, biomaterials, biology

Provides accurate, repeatable results compliant with ISO 14577 standard

Dynamic properties characterization via continuous measurement of stiffness by indent depth

Exclusive nanoindenter method for substrate-independent measurements of thin film materials

Real-time control, easy test protocol development, precision drift compensation via software