NaioAFM - All-in-One Atomic Force Microscope

The NaioAFM is an atomic force microscope designed specifically for nanoeducation and fundamental research on tiny samples. This all-in-one AFM system delivers good performance and ease of use at a price and footprint that is suitable for everyone and any application.

Popular user-friendly design

All standard operating modes available

All-in-one plug-and-play AFM system

For several years we have used the Easyscan 2 and the NaioAFM to provide AFM training, for student research projects and demonstrations. These AFMs have provided us with years of exceptional use. They have allowed students to acquire complex skill sets associated with AFM imaging with great ease.

Dr. Wesley C. Sanders, Associate Professor, Engineering Department, Salt Lake Community College

Dr. Wesley C. Sanders added, “The efficient design of the AFM hardware and the user-friendly software has been ideal for students enrolled in our semester-long AFM course. In addition to high-quality instrumentation, Nanosurf scientists have provided us with fast and outstanding service. I highly recommend using Nanosurf AFMs for educational, training, and research purposes.”

Get Started Within Minutes

Simply connect the power and USB connections to the NaioAFM, launch the user-friendly softwareand the application is ready to go in minutes.There is no need for any further setup.

To understand how simple it is, watch the overview video. Since the NaioAFM includes a cantilever alignment chip, cantilever interchange issimple, and laser alignment is no longer necessary. To see how it is done, watch the video of the cantilever exchange.

NaioAFM System OverviewPlay

Video Credit: Nanosurf AG

User’s Experience

The NaioAFM allows new users to acquire meaningful AFM images and data in as little as two hours. In the context of a highly time-constrained course, when perhaps only a total of twelve lab hours are planned, this efficiency is a significant advantage over many other AFMs, for which the time commitment might be two or three times greater.

Dr. Nancy Burnham, Professor, Physics Department, Worcester Polytechnic Institute

YouTube Tutorial Videos

NaioAFM Tutorial 1, Basic IntroductionPlay

This playlist of 12 videos by Dr. Nancy Burnham shows how the NaioAFM is used in atomic force microscopy classes at the Physics department of the Worcester Polytechnic Institute. Video Credit: Nanosurf AG

NaioSTM Imaging Modes

This diagram depicts the instrument’s many modes. Some modes may involve the use of extra hardware or software. Please see the brochure for further information.

Standard Imaging Modes

Dynamic force mode (Tapping mode)

Phase imaging mode

Static force mode

Magnetic Properties

Magnetic force microscopy

Electrical Properties

Electrostatic force microscopy (EFM)

Scanning spreading resistance microscopy (SSRM)

Conductive AFM (C-AFM)

Mechanical Properties

Force modulation

Force mapping

Stiffness and modulus

Force spectroscopy

Adhesion

Other Measurement Modes

Lithography and nanomanipulation

System Specifications

Table 1. Scanner.Source: Nanosurf AG

⁽¹⁾ Manufacturing tolerances are ±10%

Table 2. Cantilever.Source: Nanosurf AG

System Dimensions

Image Credit: Nanosurf AG