More Accurate Chemical Quantification With Talos F200X G2 TEM

上海仪舶实验室自动化 25-01-23 13:59:01

More Accurate Chemical Quantification With Talos F200X G2 TEM

Industry-leading energy dispersive X-Ray spectroscopy (EDS) signal detection is combined with exceptional high-resolution STEM and TEM imaging in the Thermo Scientific Talos F200X STEM scanning transmission electron microscope. Four in-column SDD Super-X detectors with exceptional purity perform 2D/3D chemical characterization with compositional mapping.

The Talos F200X scanning transmission electron microscope enables high-resolution TEM and STEM (HRTEM and HRSTEM) imaging with rapidnavigation for dynamic microscopy, as well as the fastest and most accurate EDS analysis in all dimensions.

Reduced environmental sensitivity is another feature of the Talos F200X scanning transmission electron microscope. The instrument enclosure moderates the effects of air pressure waves, air flows, and minute temperature changes in the TEM chamber.

STEM Imaging and Chemical Analysis

The Talos F200X (S)TEM provides rapid, accurate, quantitative characterization of nanomaterials in several dimensions. The Talos F200X (S)TEM has cutting-edge capabilities that boost throughput, accuracy, and user-friendliness, making it perfect for advanced research and analysis in government, academic, semiconductor, and industrial settings.

Large-area correlative imaging at high resolution is becoming more and more necessary because it gives researchers statistically sound data while preserving the context of their observations. Thermo Scientific Maps Software (enabled byThermo Scientific Velox Software) automatically obtainsa variety of images from a sample and stitches them together to produce a large finalimage.

Unattended image acquisition is even possible. All the advantages discussed in this section are included in the Automated Particle Workflowpack, which also includes special processing on a dedicated processing PC using Thermo Scientific Avizo2D software. The parameters of nanoparticles (such as size, area, perimeter, shape, factor, contacts, and more) can also be obtained automatically.

The fully automated and unattended software bundle allows the user to utilize the Talos F200X (S)TEM around the clock, obtain considerably better statistics, and substantiallyincrease repeatability as operator bias is eliminated.Align Genie Automation Software eases the learning curve for inexperienced operators, minimizes tensions in a multi-user setting,and enhances the expert operator's time to date.

Key Features

Talos F200X G2 Transmission Electron Microscope Features

Available With a Wide Range of High-Resolution Field Emissions Guns (FEG)

Select the ultra-high-brightness Cold Field Emission Gun (X-CFEG) or high-brightness X-FEG. The optimal energy resolution and (S)TEM imaging are combined in X-CFEG.

Faster Time to Chemical Composition

Quick, accurate quantitative EDS analysis provides highly clean, nanoscale details in 2D and 3D.

Space for More

For dynamic tests, include application-specificin situ sample holders.

Highly Repeatable Data Collection

Users always start from optimumimaging conditions since all daily TEM tunings (including focus, eccentric height, beam shift, condenser aperture, beam tilt pivot points, and rotation center) areautomated. As experiments can be replicated reproducibly, users can concentrate on research rather than equipment operation.

Intuitive Software

Thermo Scientific Velox Software provides rapid and simple acquisition and evaluation ofmultimodal data.

Better Image Data

Better contrast for high-quality images is offered by high throughput STEM imaging with simultaneous, multiple signal detection.

High-Quality (S)TEM Images and Accurate EDS

Obtain high-quality STEM orTEM images with the advanced, user-friendly Velox Software interface. Velox Software's unique EDS absorption correction allows for extremely precise measurement.

Increased Productivity

Ultra-stable column and remote operation using the SmartCam Camera. Constant-power objective lenses for swift mode andhigh-voltage (HT) switches.For multi-user situations, switching is quick and simple.

Product Specifications

Source: Thermo Fisher Scientific – Electron Microscopy Solutions

. .
HRTEM line resolution
  • ≤0.10nm

  • STEM resolution
  • ≤0.16 nm (X-FEG)

  • ≤0.14 nmwith 100pA(X-CFEG)

  • Super-X EDS system
  • 4 SDD symmetric design, windowless, shutter-protected

  • Electron energy loss spectroscopy (EELS) energy resolution
  • ≤0.8 eV (X-FEG)

  • ≤0.3 eV (X-CFEG

  • Gunbrightnessat200kV
  • 1.8×109A /cm2srad(X-FEG)

  • 2.4×109A /cm2srad(X-CFEG)

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