Image Metrology A/S
Image Metrology was founded in 1998. Today we are a world wide leading supplier of image processi……...
The NanoScanZ 100 from Prior Scientific provides the end user with nanometer level repeatability for movement in the Z axis, making the device an exceptional choice for three-dimensional reconstruction, extremely close inspection, and Z-stacking.
The NanoScan Z is faster than an objective collar, and can complete all its movements within 10 ms. It is compatible with Prior’s H117 and HLD117 stages for a broad range of inverted microscopes. The NanoScan Z is available with a range of inserts, making it ideal for loads up to 500 g.
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Key Features
The main features of the NanoScanZ 100 are listed below:
Accurate and fast
Linear orientation - Z axis
1 nm repeatability
100 µm of movement
It is possible to load up to 500 g
Image Metrology was founded in 1998. Today we are a world wide leading supplier of image processi……...
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