Micro-XRF Spectrometer for Layer Composition Analysis

The M1 MISTRAL is a versatile, benchtop, energy dispersive micro-XRF spectrometer that delivers precise information on the elemental composition and thickness of bulk materials, coatings and individual layers in multi-layer systems. As well as being cost-effective for use in industrial settings the system is also quick and easy to use.

A minimum spot size of 100 µm allows users to resolve minute structural features on circuit boards and chips

Layer composition analysis is possible for multilayered systems with a thickness range between 2 nm – 60 µm in accordance with ISO 3497 and ASTM B568

Low 8 ppm limit of detection for copper, zinc and lead in polymers, as well as the ability to screen for trace elements in solders and metal alloys.

Coatings and bulk materials can be analyzed by the M1 MISTRAL in accordance with ASTM standard B568 and European norm ISO 3497. The M1 MISTRAL can also be used for the analysis of alloys and precious metals – allowing the elements present in a sample to be quantified as either a percentage weight or in carats.

To achieve even greater degrees of precision, analysis can be carried out either using a standard or standardless. For each application, a wide range of calibrations are available.

The M1 MISTRAL’s entire analysis workflow is incorporated into its XSpect Pro software, starting with sample logging and ending with the printing of results in a report. Raw data remains available throughout the analysis process to ensure transparency.

Key Features

User-friendly touch screen interface

Access to raw data

Easy to operate

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