Benchtop Raman Spectrometer - MacroRAM™
HORIBA Scientific’s new MacroRAM™ Raman spectrometer offers simplicity to Raman measu……...
Low Energy Surface Preparation with the Ilion II System
The Ilion II system is perfect for low-energy surface preparation for SEM cross-section viewing.
Features:
Quick workflows on beam-sensitive samples: Vacuum load-lock and liquid nitrogen cold stage for quick workflows on beam-sensitive samples
Real-time polishing method observation: such as an optical microscope with digital imaging; images can be stored and examined with Gatan’s DigitalMicrograph®software
Using 10" color touch screen interface: Reproducible outcomes from recipes and function of the IlionTMII through a 10" color touch screen interface
Damage-free surfaces: for analytical techniques like cathodoluminescence and EBSD, where the signal is produced close to the surface.
Demonstrating XS sample mounting
XS sample mounting for Ilion II and PECS II systems
XS sample mounting. A procedure that outlines best practices for adhering electron microscopy samples onto the Ilion II or PECS II mounting jig before initiating the argon ion milling process. Video Credit: Gatan Inc.
Tutorials on cleaning the guns and cold cathode gauge
Cleaning the guns and cold cathode gauge for EM specimen preparation (version 2)
Cleaning the guns and cold cathode gauge. Tutorial on how to clean the guns and cold cathode gauge on your PECS, PIPS, or Ilion system. Video Credit: Gatan Inc.
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