Laser Autofocus System – For use with Semiconductor Wafers and Hard Disc Drive Platens

The LF210 Laser Autofocus system from Prior Scientific can be used with a variety of reflective samples, including hard disc drive platens and semiconductor wafers. Shooting a laser beam on the surface under analysis will allow the system to maintain optimum focus on the specimen at high magnifications, even while moving the sample or the stage.

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Key Features

Wide choice of mounting flanges to fit into specific microscopes

User-selectable sport or line laser modes enable the system to be used for all scanning modes and sample types

A piezo focusing stage or a stepper motor focus drive can be controlled through a 0-10 v output

The LF210 is the most stable laser focus unit available on the market, as it features the modulated laser diode

Provides rapid and accurate autofocusing for reflective samples

LF100K keypad for standalone operations

It is a more stable and sensitive system, as it includes various refinements and is developed from the LF100, an industry benchmark.