LabRAM Odyssey Nano: AFM-Raman for Physical and Chemical Imaging

TheLabRAM Odyssey Nano is acompletely integrated system based on SmartSPM cutting-edge scanning probe microscope and LabRAM Odyssey completely automated Raman micro-spectrometer.

LabRAM Odyssey Nano provides full automation, broad compatibility, and exceptional performance.

The LabRAM Odyssey Nano combines ease of use and extreme flexibility for the most demanding applications. With capabilities from deep UV to infrared, high spectral resolution, and an extended set of options and accessories, the LabRAM Odyssey Nano is perfectly suited to perform in any research areas.

Features

Multi-Sample Analysis Platform

Macro, micro, and nano size measurements can be performed on the same platform.

Ease-of-Use

Entirely automated operation; begin measuring in minutes rather than hours.

True Confocality

High spatial resolution, automated mapping phases, and complete microscope visualization capabilities are all available.

High Collection Efficiency

Top-down and oblique Raman detection for improved resolution and throughput in co-localized and Tip-Enhanced measurements (Raman and Photoluminescence).

High Spectral Resolution

Optimal spectral resolution performance, numerous gratings with automatic switching, and Raman and PL spectral range analysis.

High Spatial Resolution

Tip Enhanced Optical Spectroscopies (Raman and PhotoLuminescence) provide nanoscale spectroscopic resolution (down to 10 nm).

Multi-Technique/Multi-Environment

Numerous SPM modes are available, including AFM, conductive and electrical modes (cAFM, KPFM), STM, liquid cell and electrochemical environment, and chemical mapping via TERS/TEPL.

Full control of the two instruments through one workstation and powerful software control, SPM and spectrometer can be operated simultaneously or independently.

Robustness/Stability

AFM scanners with high resonance frequencies operate far away from the noise.High performance is attained without the need for active vibration isolation.

Specifications

SmartSPM Scanner and Base

Sample scanning range: 100 µm × 100 µm × 15 µm (±10%)

Scanning type by sample: XY non-linearity 0.05 %; Z non-linearity 0.05 %

Resonance frequency: XY: 7 kHz (unloaded); Z: 15 kHz (unloaded)

Noise: 0.1 nm RMS in XY dimension in 200 Hz bandwidth with capacitance sensors on; 0.02 nm RMS in XY dimension in 100 Hz bandwidth with capacitance sensors off; <0.04 nm RMS Z capacitance sensor in 1000 Hz bandwidth

Sample positioning: Motorized sample positioning range 5 × 5 mm

Sample size: Maximum 40 × 50 mm, 15 mm thickness

X, Y, Z movement: Digital closed loop control for X, Y, Z axes; Motorized Z approach range 18 mm

Positioning resolution: 1 µm

AFM Head

Laser wavelength: 1300 nm, non-interfering with spectroscopic detector

Alignment: Completely automated cantilever and photodiode alignment

Registration system noise: Down to <0.1 nm

Probe access: Unrestricted access to the probe for additional external manipulators and probes

SPM Measuring Modes

Contact AFM in air/(liquid optional); Semicontact AFM in air/(liquid optional); Non-contact AFM; Force Modulation; Phase imaging; Lateral Force Microscopy (LFM); Magnetic Force Microscopy (MFM); Conductive AFM (optional); Kelvin Probe (Surface Potential Microscopy, SKM, KPFM); Force curve measurement; Capacitance and Electric Force Microscopy (EFM); Nanolithography; Nanomanipulation; STM (optional); Piezo Response Force Microscopy (PFM); Photocurrent Mapping (optional); Volt-ampere characteristic measurements (optional).

Spectroscopy Modes

Confocal Raman, Fluorescence, and Photoluminescence imaging and spectroscopy

Tip-EnhancedPhotoluminescence (TEPL)

Near-field Optical Scanning Microscopy and Spectroscopy (NSOM/SNOM)

Tip-Enhanced Raman Spectroscopy (TERS) in AFM, STM, and shear force modes

Conductive AFM Unit (Optional)

Current Range: 100 fA ÷ 10 µA; 3 current ranges (1 nA, 100 nA, and 10 µA) switchable from the software

Optical Access

Capability to use top and side plan apochromat objective simultaneously: Up to 100×, NA = 0.7 from top or side; Up to 20× and 100× concurrently

Piezo objective scanner with closed loop for super stable long-term spectroscopic laser alignment: Range 20 µm × 20 µm × 15 µm; Resolution: 1 nm

Spectrometer

Completely automated high resolution LabRAM Odyssey micro-spectrometer, capable of functioning as a standalone micro-Raman microscope.

Wavelength range: 50 cm^-1 to 4000 cm^-1 or down to 10 cm^-1 with Ultra Low Frequency (ULF) filter option

Optical design: Achromatic spectrograph and achromatic coupling optics

Gratings: Selection of gratings from 150 g/mm to 3600 g/mm; two gratings on the computer-controlled turret, kinematically mounted and easily exchangeable

Automation: Fully motorized, software-controlled operation

Detection

Full range of CCD detectors, EMCCDs and InfraRed detectors: InGaAs array, single channel extended InGaAs, InSb, CdTe.

Laser Sources

Typical wavelength: 532 nm, 638 nm, 785 nm

Wavelengths: Full range of wavelengths from DUV (229 nm) to IR (up to 2.2 µm)

Automation: Completely automated laser and filter switching for up to threesimultaneous lasers; Laser polarization selection and spectral analyzer options for all wavelengths

Software

Full-featured SPM, spectrometer, and data acquisition control, spectroscopic and SPM data analysis and processing suite, including spectral fitting, deconvolution, and filtering, optional modules include univariate and multivariate analysis suite (PCA, MCR, HCA, DCA), particle detection, and spectral search functionality.