ZEISS Xradia 810 Ultra Non-Destructive Nanoscale Imaging
Users can achieve spatial resolution down to 50 nm using ZEISS Xradia 810 Ultra X-ray microscope ……...
K-TEK Nanotechnology
K-Tek Nanotechnology LLC, a distributor of AFM accessories, supplies the most well known and latest technology the SPM industry has to offer. With proven quality and competitive pricing, our products - that use only the best materials will keep your AFM equipment working smoothly.
We work hard to provide prompt delivery and hands on customer service and are the ideal source for cantilevers, diamond coated probes, Super Sharp Diamond-Like Carbon tips, calibration gratings, SNOM probes, test samples and HOPG.
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